Release of a New Electron Microscope JEM-2100Plus

JEOL Ltd. (President Gon-emon Kurihara) announced a new 200 kV transmission electron microscope incorporating a thermionic-emission electron gun, JEM-2100Plus, to be distributed in June 2015.

Product development background

Transmission electron microscope (TEM) has long been a tool essential for micro structure evaluation. The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.

Main Features

Designed to ease of operation

64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation.

Advanced integration

The TEM Center allows the user to control optional accessories such as high resolution camera and scanning image (BF/DF) observation device through intuitive user-system interaction.

A complete range of automated functions

The JEM-2100Plus comes with a complete range of automated functions, including auto focus, auto contrast/brightness, auto exposure, auto montage, drift compensation, and stage navigation.

Image view/edit software

Viewer software supports off-line image viewing and editing.

Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.

Main Specifications

Maximum accelerating voltage 200kV

Guaranteed resolution 0.14 nm (TEM lattice image)

Magnification x30 to x800,000

The JEM-2100Plus can be configured to support a variety of applications from cryo TEM

to ultra high resolution imaging.

JEM-2100Plus

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