MikroMasch® Introducing OPUS™ AFM Tips, Featuring Tip Visibility
The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.
OPUS™ tips are available on all standard cantilever types for all commonly used AFM applications, including high speed scanning. OPUS™ AFM probes also offer all major coatings that are being used in AFM.
Other important features of OPUS™ AFM probes are:
Tip sharpness better than 7 nm
High Q-factor and smooth resonance curves
A highly competitive pricing
Evaluation samples will be provided free of charge to interested AFM users.

