Hillsboro, Ore./June 5, 2009?FEI Company (Nasdaq: FEIC), a leading provider of atomic-scale imaging and analysis systems, today announced the immediate availability of Phenom™ Remote Assistant, a new service enhancement that allows for remote tracking, diagnostics and repair of Phenom personal scanning electron microscope (SEM) systems.

“Phenom Remote Assistant enhances productivity by providing reduced time to repair, and increased reliability and up-time of the system,” said Paul Scagnetti, FEI’s Industry Division vice president and general manager. “Our customers can anticipate service problems before they arise and resolve them with the help of FEI service engineers remotely.”

The Phenom Remote Assistant is powered by RAPID (Remote Access Program for Interactive Diagnostics), which is FEI’s secure infrastructure for remote diagnostics. RAPID provides a highly-secure, encrypted, VPN (virtual private network) connection between the customer and FEI service engineer. All remote connections are initiated from the Phenom side, so the customer is always in complete control.

Phenom Remote Assistant reduces the likelihood that customers will have to take a Phenom off-line and return it to the service center. FEI service engineers can remotely track key performance metrics over time, run service test diagnostics on the system, check and modify tool settings, and even view microscope images to access quality and provide expert operations advice.

The Phenom Remote Assistant is available at no additional charge with all Phenom personal SEMs. The Phenom is a unique imaging tool that makes high-end imaging practical and affordable for both educational use as well as a variety of industrial applications. It combines light optical and electron optical technologies in one integrated, easy-to-use microscope system. Offering magnification of up to 24,000x and 30 nm resolution (about 100,000 times smaller than the diameter of a human hair) in 30 seconds, the Phenom opens the door to the micro- and nanoscale worlds. For more information, please visit: www.phenom-world.com.

About FEI

FEI (Nasdaq: FEIC) is the world’s premiere provider of electron and ion-beam microscopes for nanoscale research and manufacturing across many industries: industrial and academic research, life sciences, electronics, mining, and more. FEI’s imaging systems provide 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Ångström level (one-tenth of a nanometer). With a 60-year legacy of technological innovation and leadership, FEI has set the performance standard across the TEM, SEM, and DualBeam™ FIB/SEM microscope categories with its Titan™, Magellan™ and Helios NanoLab™ product families. FEI’s NanoPorts in North America, Europe and Asia provide centers of technical excellence where its world-class community of customers and specialists collaborate. FEI has sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.

FEI Safe Harbor Statement

This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the Phenom and anticipated availability date of the service enhancement. Factors that could affect these forward-looking statements include but are not limited to failure of the product or technology to perform as expected and achieve anticipated results, unexpected technology problems and our ability to manufacture, ship and deliver the tools as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.