MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, continues to lead the industry with its recent release of OIM™ Analysis 8.0. Widely established as the premier microstructural visualization and analysis tool for the interrogation and understanding of EBSD mapping data, OIM™ Analysis now includes multiple new features that enable analysts to achieve new insights into their materials characterization.

Multithreaded Operations use optimized code to take advantage of modern multicore CPUs ensuring faster map rendering, highlighting and characterization calculations for performance improvements, which scale with the number of cores available.

EBSD Pattern Indexing offers users the ability to re-index data points within an OIM™ mapping dataset, so that an existing dataset can be re-indexed by point, by partition or by using the complete dataset. Analysts can improve EBSD indexing performance at or away from the microscope using EDAX’s triplet indexing