COLUMBUS, Ohio — At the Microscopy & Microanalysis 2016 Meeting, Bruker today introduces the e-FlashFS and e-FlashHD, two models of a new generation of detectors for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM), and ESPRIT™ QUBE, a new software package for advanced post-processing and visualization of 3D EBSD/EDS data cubes.

EBSD detectors e-FlashHD and e-FlashFS (with optional OPTIMUS(TM) TKD detector head)

With the fast and sensitive e-FlashFS and the high definitione-FlashHD Bruker now offers two complementary detectors to optimally cover all EBSD applications from everyday characterization of minerals and alloys to advanced analysis of nano- and functional materials.

Due to an increase in sensitivity by a factor of three compared to its predecessor e-Flash1000, the new e-FlashFSwill significantly expand the range of application fields where high-speed EBSD can be used. The combination of improved sensitivity and high speed makes the e-Fla