Surface Science: Product Introductions

FEI introduced the Expida 1255S wafer DualBeam system for STEM sample preparation.

FEI released the Vitrobot Mark IV cryo sample preparation tool.

FEI released microValidator software for scanning electron microscopes and X-ray microanalysis systems used for automated particle and phase search analysis. It is compatible with EDAX and Bruker systems.

FEI introduced the Nova NanoSEM 30 Series, consisting of the 230, 430 and 630 models.

Veeco introduced the compact, lower-priced Innova SPM, featuring closed-loop scanning.

Carl Zeiss Microimaging GmbH launched ZEN 2007 software for its laser scanning microscopes.

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