Nanosurf, a leading provider of atomic force microscopes (AFM) and scanning tunneling microscopes (STM), and Zurich Instruments, technology leader for lock-in amplifiers and phase-locked loops (PLL), today announced a strategic technology partnership. The two companies have agreed to cooperate in the development of high-frequency, high-performance scanning probe microscopy (SPM) solutions, to provide mutual communication interfaces […]

CENTER VALLEY, Pa. – The Olympus VS110-Fluorescence (VS110-FL) virtual slide microscope scanning system is now available in the U.S. Based on award-winning technology, the new VS110-FL offers unparalleled flexibility for both fluorescence and brightfield applications, with high-performance optics that can capture images at various magnifications and depths within the specimen. Virtual microscopy generates high-resolution images […]

ISSAQUAH, Wash. – Applied Precision will be showcasing their newly expanded DeltaVision microscopy product family at the Biophysical Society Annual Meeting in Baltimore, March 5-9. The featured products will include new systems and several configuration options for the ground-breaking DeltaVision OMX? 3-D, super-resolution microscopy system. The OMX V4? SI system is the 4th generation of […]

PLEASANTON, Calif. and HOPKINTON, Mass – IntegenX Inc. (a privately held corporation) and Caliper Life Sciences, Inc. (NASDAQ: CALP) today announced a license agreement providing IntegenX access to Caliper’s microfluidics patent portfolio. IntegenX will leverage its proprietary MOVe™ microvalve technology and Caliper’s microfluidic intellectual patent estate to accelerate commercialization of its Apollo 200 RapidHIT™ DNA […]

HILLSBORO, Ore. and GRENOBLE, France – FEI (Nasdaq:FEIC) and CEA-Leti today announced the companies have entered into a three year agreement to characterize advanced semiconductor materials for the 22nm technology node and beyond. European-based CEA-Leti, with its two partners on the NanoCharacterization Platform of MINATEC Campus, CEA-Liten (new materials for new energies) and CEA-INAC (Nanoscience […]

Hillsboro, Ore. – President Barack Obama finally got to see his atoms, courtesy of Intel and FEI’s Titan transmission electron microscope. The President visited Intel Hillsboro’s Ronler Acres facility as part of a West Coast technology tour wrapping Friday, February 18. During his visit to the TEM lab, the President made his way through photographers […]

San Dimas, CA – CRAIC Technologies, Inc., the world’s leading innovator of UV-visible-NIR microscopy solutions, joins with Laboratory Imaging, s.r.o., a leading specialist in imaging software solutions for microscopy, to introduce rIQ™: the intelligent solution for the analysis of glass trace evidence. rIQ™, which stands for Refractive Index Quantification, is the result of a collaboration […]

Hitachi High-Technologies Corporation (TOKYO: 8036, Hitachi High-Tech) announces the introduction of the new SU8000 family of Field Emission Scanning Electron Microscopes (FE-SEM) which includes the SU8040 launched on August 1, 2010. The new SU8000 family will be available from February 14, 2011. Research is being conducted around the world on next-generation technologies that incorporate nanotechnologies […]

HILLSBORO, Ore. – FEI Company (Nasdaq:FEIC) today announced that Dr. Ad Huijser has joined the company’s board of directors. Dr. Huijser was executive vice president, chief technology officer and member of the Board of Management of Koninklijke Philips Electronics N.V., until his retirement in 2006. During his 36-year career with Philips he held various senior […]