JENA/Germany — The United States Patent and Trademark Office has granted Dr. Eric Betzig and Dr. Harald Hess another patent for their invention of super- resolution localization microscopy. In 2007, the microscopy from Carl Zeiss received the exclusive rights to market the technology. Together with the previously issued patents (U.S. 7,626,694, U.S. 7,828,695, U.S. 7,626,703 […]

MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has established a new standard in electron microscopy with its release of the Apollo Silicon Drift Detector (SDD) Series for the transmission electron microscope (TEM). The new series includes the Apollo XLT with a Super Ultra Thin Window (SUTW) and the […]

Wetzlar, Germany / Besançon, France. Leica Microsystems and Digital Surf announced the signature of an agreement whereby Leica Map surface imaging and metrology software based upon Digital Surf’s Mountains Technology® will be used with the Leica Application Suite (LAS) for Leica industrial microscopes. The new Leica Map software is used to visualize and quantify features […]

Asylum Research, the technology leader for atomic force and scanning probe microscopy (AFM/SPM), announced today that its 2010 sales set a new record, besting its record-breaking 2009 by nearly 20%. The new record was fueled by increasing acceptance of Asylum’s Cypher™ Atomic Force Microscope, the world’s highest resolution AFM. Sales also accelerated for the MFP-3D-BIO™ […]

Camera Particle Tracking (CPT) technology enhances quantitative measurement capabilities in research involving optical trapping and is now available as an option on Elliot Scientific Tweezer systems. Current systems can only measure the force exerted on one particle, but the CPT technology will enable the collection of data from multiple particles at a higher rate. This […]

Two global technology leaders to provide most advanced tools available in laser-based imaging for biomedical research MELVILLE, N.Y. – Nikon Instruments Inc., an innovator of advanced optical instruments, today announced an agreement with Agilent Technologies, the world’s premier measurement company and a technology leader in chemical analysis, life sciences, electronics and communications, for distribution in […]

Hillsboro, Ore. FEI Company (NASDAQ: FEIC), a leading instrumentation company providing electron microscope systems for applications in research and industry, today announced that the CANMET Materials Technology Laboratory (CANMET-MTL), a research center funded by the Canadian government, has selected three of FEI’s latest electron microscope systems for its new facility at the McMaster Innovation Park, […]