Mannheim, Germany – Leica Microsystems has effectively matched the Leica TCS SP5 MP multiphoton microscope with a fully integrated OPO (Optical Parametric Oscillator) solution. The integration of the Coherent Chameleon Compact OPO with the Leica TCS SP5 MP confocal and multiphoton microscope allows observation of fast dynamic processes in living cells with deep penetration at […]

LONGUEUIL, QC – Clemex Technologies, Inc. (the Company) or (Clemex), announces that is has concluded an agreement with Leica Microsystems, Inc. for the distribution of microscopes for industrial applications in Canada. The agreement, which grants Clemex the exclusive distribution of Leica Microsystems’ microscopy products in specific market segments for most of Canada, will become effective […]

Topographic Confocal Raman Imaging -The next evolutionary leap in cutting-edge microscope configurations WITec, worldwide leader in nano-analytical microscopy systems, has launched the new True Surface Microscopy option. The core element of this revolutionary imaging mode is an integrated sensor for optical profilometry. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the […]

The Magellan Provides Life Scientists With a Workflow Solution to Ensure High Quality Results HILLSBORO, Ore. – FEI Company (Nasdaq:FEIC), a leading instrumentation company providing electron microscope systems for applications in research and industry, today announced the Magellan™ extreme resolution scanning electron microscope (SEM) optimized specifically for life science imaging. The first of its kind, […]

Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), announced today that it has installed a dual system order for a Cypher™ AFM and MFP-3D-SA™ AFM at the Cluster of Excellence “Smart Interfaces” (CSI), Technische Universität Darmstadt in Germany in the lab of Professor Robert Stark, new professor for Physics of Surfaces in […]

Agilent Technologies Inc. (NYSE: A) today announced that the Department of Electrical Engineering at South Dakota State University (SDSU) has installed three additional scientific-grade atomic force microscopes (AFMs). Two of the new instruments, an Agilent 5500 AFM and an Agilent 5420 AFM, will be used by the nano research group, led by Dr. Venkat Bommisetty […]

Continuing the PeakForce Tapping Revolution in AFM BOSTON – Bruker Corporation (NASDAQ: BRKR) announced today at the Materials Research Society (MRS) Fall 2010 Meeting the release of a new generation of Atomic Force Microscopy (AFM) modes and measurement modules that transform Bruker’s AFM systems into turnkey solutions for nanoscale characterization in renewable energy research. The […]

Revolutionary Patent-Pending Capability Enables ContourGT Optical Surface Profilers to Deliver Unprecedented Lateral Resolution BOSTON – Bruker Corporation (NASDAQ: BRKR) announced today at the Materials Research Society (MRS) Fall 2010 Meeting the AcuityXR(TM), a novel optical surface profiler mode that combines unique, patent-pending Bruker hardware and software technology to enable select ContourGT(TM) non-contact, 3D optical surface […]

SEATTLE – Glencoe Software, Inc., a leading provider of image data management tools for life science and biopharmaceutical research, and a member of the Open Microscopy Environment Consortium, is pleased to announce the next release of its flagship software packages, Bio-Formats, the world-leading image file translation tool, and OMERO, its image data management platform. These […]