High-Content Screening Automation for Confocal and Widefield Microscopy Wetzlar, Germany. Leica Microsystems has extended its automated high-content screening solution to cover applications on widefield fluorescence systems. The Leica HCS A package enables fast and efficient multi-position experiments – from automated image recording routines to complex multi-dimensional high-content screening experiments with simultaneous image export for immediate […]

Covance increases its discovery and translational services imaging portfolio with high resolution intravital microscopy technology and expertise— Princeton, NJ – Covance and INphoton LLC today announced a collaborative relationship which will grant Covance exclusive global access to INphoton’s intravital microscopy imaging technology and expertise. The new services offered as a result of the companies’ collaboration […]

BILLERICA, Mass. – Bruker Corporation (NASDAQ: BRKR) today announced the closing of its acquisition of the Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM) instruments businesses from Veeco Instruments, Inc. (NASDAQ: VECO) for $229.4 million in cash. The industry-leading AFM scientific instruments business headquartered in Santa Barbara, California, as well as the OIM […]

Sunrise Optical, LLC, and Neoteric Concepts, LLC, signed joint venture partnership to market, and to produce a high NA, broad-band, all-reflective, diffraction limited confocal microscope objective. Sunrise, FL – Sunrise Optical, LLC, and Neoteric Concepts, LLC, signed joint venture partnership to market, and to produce a high NA, broad-band, all-reflective, diffraction limited confocal microscope objective. […]

Companies explore potential development and market opportunities for hybrid AFM/DualBeam system. Hillsboro, Ore. – FEI Company (NASDAQ: FEIC), a leading instrumentation company providing electron microscope systems for applications across many industries, announces that it has entered into an agreement to collaborate with Nanonics Imaging Ltd., based in Israel, to explore the feasibility of adding an […]

Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), announced today that it has delivered the Cypher™ AFM to the Consejo Superior de Investigaciones Científicas (CSIC) at the Instituto Microelectronica in Madrid, Spain. Professor Ricardo Garcia’s group at CSIC will use the new Cypher system for high resolution imaging /detection of biomolecules and […]

Peabody, Mass. – JEOL offers a whole new electron microscope experience with the introduction of the InTouch Scope™, an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The new InTouch Scope has the familiar feel of today’s personal electronic media. The intuitive […]

MADISON, Wisconsin – Thermo Fisher Scientific Inc., the world leader in serving science, today announced that the University of Maryland Dental School is utilizing Thermo Scientific EDS detectors to further investigate the long-debated nature of “worm-like” cylindrical structures observed in the dentinal tubules of extracted human teeth. Utilization of the EDS detectors has made it […]

Peabody, MA – JEOL announces a major order for the company’s atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the […]

Carl Zeiss ORION® Plus Helium Ion Microscope moves beyond sub-nanometer imaging to advance the fabrication of nano-electronic and nano-photonic devices PEABODY, Massachusetts, USA – Scientists are currently investigating new uses for Helium Ion microscopy in nano-patterning. Since it is not limited by the proximity effect of conventional e-beam lithography, Helium Ion technology seems to be […]