Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Spectrometry (EDS / EDX) have been added to the materials testing and failure analysis capabilities performed at Laboratory Testing Inc. of Hatfield, PA. The new system allows for high magnification evaluation, element analysis and material characterization. Hatfield, PA – Laboratory Testing Inc. (LTI) now performs Scanning Electron […]

Munich, Germany – ibidi GmbH, a supplier of solutions for Bio-Microscopy, releases LifeAct, a novel probe for visualization of Actin cytoskeleton organization and dynamics. In the past, Actin markers visualized Actin but also disturbed the acitivity of the protein. In contrast, the new Actin marker LifeAct from ibidi binds to the structure protein without constraining […]

New Family of Electron Microscopes Combines Ultra-High Resolution and Analytical Performance for the Widest Range of Materials HILLSBORO, Ore. – FEI Company (Nasdaq:FEIC), a leading scientific instrumentation company providing electron microscope systems for nanoscale applications across many industries, announced today the availability of its new Nova(TM) NanoSEM 50 Series of ultra-high resolution scanning electron microscopes […]

Bio-specific applications provide new automation, navigation and data processing capabilities for the 3D ultra-structural imaging of biological systems Hillsboro, Ore. – FEI Company (NASDAQ: FEIC), a leading scientific instrumentation company providing electron microscopy systems for nanoscale applications across many industries, released today a set of software applications that increase the throughput and ease-of-use of its […]

For the first time, atomic force microscopy helps scientists reveal the exact chemical structure of a natural compound Using this fast and accurate technique could open new possibilities in drug discovery and treatments Compound was extracted from a mud sample taken from the Mariana Trench, 10,916 meters (35,814 feet) below sea level ABERDEEN, Scotland & […]

SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced the introduction of the Agilent 8500 field emission scanning electron microscope (FE-SEM). The 8500 is a compact system that offers researchers a field emission scanning electron microscope for low-voltage, high-performance imaging in their own laboratory. The innovative 8500 has been optimized for low-voltage imaging, […]

Former FEI Executive becomes Senior Vice President Sales of Nano Technology Systems division of Carl Zeiss PEABODY, Massachusetts, USA – Carl Zeiss today announced that Emile James (Jim) Pouquette, a former FEI Executive, has joined Carl Zeiss SMT North America as senior vice president sales. Pouquette, an honors graduate in Business Administration from California State […]

Smooth Operating even at high magnification observation Hitachi High-Technologies Corporation (TOKYO:8036) has developed the SU8040, a new type of Field Emission Scanning Electron Microscope (FE-SEM) that features a newly developed Regulus (REGULated Ultra Stable) Stage. The SU8040 will be introduced on August 1. Now FE-SEM becomes an indispensable tool for semiconductor industry and cutting-edge nanotechnology […]

A new, integrated gas injection system on the ORION® Plus Helium Ion Microscope delivers superior nanofabrication, deposition and etch. PEABODY, Massachusetts, USA – Carl Zeiss today introduced a new Gas Injection System for the ORION® Plus Helium Ion Microscope. The combination of a sub-nanometer (less than 0.35nm) probe of inert gas ions with a small […]

A New Class of Transmission Electron Microscope Enabling Novel Work Environments HT7700 LCD Screen Observation Allows for Simplified Operation and Observation in Normal Room Light Microscopy & Microanalysis 2010 TOKYO – Hitachi High-Technologies Corporation (TOKYO:8036)(Hitachi High-Tech) has announced the development and release of the HT7700, a new type of transmission electron microscope (TEM)(*) that integrates […]