Raleigh, NC – Protochips, a company specializing in revolutionary products for in situ electron microscopy, today announced the Poseidon™ solution for in situ characterization of materials in liquid directly within the transmission electron microscope (TEM). Poseidon™ allows scientists and engineers to image both materials and biological samples that are self-contained within a fully hydrated environment, […]

Industrial applications and inline process control in focus. Ulm, – WITec GmbH announces the acquisition of the majority of the optical measurement solution provider omt optische messtechnik gmbh. With the addition of omt, WITec has taken an important step to further enhance its market position in the field of measurement technology for industrial applications. The […]

Facilitates Research into Organic and Hybrid Semiconductor Systems and Opto-Electronic Devices CHANDLER, Ariz. – Agilent Technologies Inc. (NYSE:A) today announced the installation of an Agilent 5500 atomic force microscope (AFM) in the Blackett Laboratory, Department of Physics, Imperial College London. “We are very excited about the possibilities that the Agilent 5500 AFM system will enable, […]

Peabody, Mass. – JEOL USA is pleased to announce that a new Cold Field Emission Gun is now available for the atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its class. Now outfitted […]

FEI to Leverage SMTC’s Mexico Operations for Large Scale System Integration TORONT – SMTC Corporation (Nasdaq: SMTX, TSX: SMX) (“SMTC”), a global electronics manufacturing services provider, announced today a strategic relationship with FEI Company (Nasdaq:FEIC) (FEI). FEI is a premier provider of electron and ion-beam microscopes and tools for nanoscale applications across many industries: industrial […]

Eindhoven – Phenom-World BV, producer of the Phenom desktop scanning electron microscope, announces the launch of a new software product, the Phenom Pro Suite. The Phenom Pro Suite applications expand the functionality of the Phenom by automated collection of images, visualize samples in 3D, measure surface roughness and automated fiber analysis. With the introduction of […]

For the first time in the company’s history, in June Anton Paar GmbH sold three SAXSess mc2 systems in a single week. Among the small-angle X-ray scattering systems’s applications: protein or food analysis, basic research or the pharmaceutical industry. The three buyers are universities and research institutes in Australia, India and France. In total, the […]

Enhanced resolution in the low kv region with new electron source technology. Cambridge, UK / Oberkochen, Germanay, – Today, Carl Zeiss introduces EVO® HD, its latest innovation in the conventional Scanning Electron Microscopy (C-SEM) market segment. Delivering much higher resolution at low acceleration voltages compared to present conventional SEM, the EVO® HD introduces High Definition […]

Hummingbird Scientific will develop nanoscale imaging technology in partnership with University of Washington’s Department of Mechanical Engineering. SEATTLE – Washington Technology Center has awarded $100,000 in state funding to the University of Washington to support a research collaboration with Hummingbird Scientific. Hummingbird Scientific, a developer of electron microscopy products located in Lacey, Washington, is partnered […]

Easy-to-Use, Seamless Integration of Advanced Complimentary Techniques PLAINVIEW, N.Y. – Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscopy technology to the nanoscience community, announced today the release of the IRIS(TM) models for Innova(R) and BioScope(TM) Catalyst(TM) Atomic Force Microscopes (AFMs) to provide superior integration and accessibility for combined atomic force microscopy […]