JENA — Carl Zeiss offers the Axio Imager Vario microscope module in particular for tasks in industry where large samples such as solar cells, wafers, flat panel screens or printed circuit boards have to be examined under the microscope with various contrasting methods. The sample space of the Axio Imager Vario has been adapted to […]

Led by Dr. Emilien Pelletier, the Institut des Sciences de la Mer de Rimouski at the Université du Québec à Rimouski has obtained an LVEM5 benchtop electron microscope to help them study the short-term and long-term effects of nano-materials on the marine environment. Dr. Pelletier is the Canada Research Chair in Marine Ecotoxicology. The overall […]

Wetzlar, Germany. At CONTROL 2010, Leica Microsystems is presenting its new series of digital microscopes Leica DVM2000-5000, the Dual-Core 3D Measuring Microscope Leica DCM 3D with combined confocal and interferometry technology, the Leica Cleanliness Expert for particle analysis and the Leica Ergoscope for an easy start to the world of high-definition microscopy. Digital Microscopy – […]

New Tool to Amplify the Power of Confocal Imaging Mannheim, Germany. High content screening is a growing discipline in life science research as the number of complex experiments is increasing and statistically relevant data become a “must” for scientific publications. Leica Microsystems has released the first High Content Screening Automation package for confocal research microscopes […]

THORNWOOD/NY — Carl Zeiss, a leading provider of microscopy solutions for a variety of research, clinical and industrial applications, recently announced a new Original Equipment Manufacturers (OEM) partner initiative. OEM companies develop and market specialized solutions and imaging systems based on a traditional microscope or highly specialized “black box” optical systems. Carl Zeiss has been […]

N8 TITANOS Large Sample Atomic Force Microscope (AFM) System BERLIN–Bruker today announced that it has been awarded a $1.1 million contract to supply a customized N8 TITANOS™ large sample Atomic Force Microscope (AFM) to the United States Commerce Department’s National Institute of Standards and Technology (NIST). The instrument will be used by NIST’s Precision Engineering […]

WHAT: Veeco Instruments Inc., the leading provider of scanning probe microscopes (SPM) to the nanoscience community, now manufactures new Sharp Nitride Lever (SNL) Probes that provide breakthrough atomic force microscope (AFM) imaging resolution and longer probe lifetimes, without higher expenses. WHY: The AFM community has long desired a silicon nitride lever with a sharper tip […]

Helios outperforms competition for failure analysis, 3D nanoscale characterization and prototyping, and other techniques. Hillsboro, Ore. — FEI Company (NASDAQ: FEIC), a leading diversified scientific instruments company providing electron and ion-beam microscopes and tools for nanoscale applications across many industries, today introduced the new Helios NanoLab™ x50 DualBeam™ Series, the most powerful and versatile DualBeam […]

MADISON, WI – AMETEK Materials Analysis Division, a leader in high-end analytical instruments used in elemental and materials analysis, has established an Atom Probe Technology Center Madison, WI, at the headquarters of the recently acquired Imago Scientific Instruments. “The Atom Probe Center further strengthens our leadership in this emerging technology by bringing together the field’s […]

SIMI VALLEY, Calif. — McBain Systems of Simi Valley announced that it has received a “2009 Industry Division Growth Award” from Leica Microsystems. McBain Systems (formerly McBain Instruments) is the country’s largest exclusive regional dealer of Leica industrial microscope products and reported a significant increase in Industry Division sales from 2008 to 2009. At Leica’s […]