National Institute for Materials Science SII NanoTechnology Inc. Kyushu University Japan Aerospace Exploration Agency JEOL Ltd. The National Institute for Materials Science (President: Sukekatsu Ushioda; hereinafter, NIMS), in a joint research project with SII NanoTechnology Inc. (President & CEO: Susumu Kitano), Kyushu University (President: Setsuo Arikawa), Japan Aerospace Exploration Agency (President: Kenji Tachikawa; hereinafter, JAXA), […]

Billerica, Massachusetts — Bruker announces the official launch of the new N8 NEOS SENTERRA micro-analysis system that combines the Raman Spectroscopy and Atomic Force Microscopy (AFM) on a single optical microscope platform. A comprehensive materials research investigation demands a multi-technique approach. Bruker Optics’ SENTERRA Raman spectrometer and Bruker Nano’s N8 NEOS Atomic Force Microscope was […]

New microscope could revolutionize imaging, improve catalysts for energy applications UPTON, NY — Scientists at the U.S. Department of Energy’s (DOE) Brookhaven National Laboratory, in collaboration with researchers from Hitachi High Technologies Corp., have demonstrated a new scanning electron microscope capable of selectively imaging single atoms on the top surface of a specimen while a […]

New System Adds to Company’s Investigative and Analytical Research Products FARMINGDALE, N.Y.–Enzo Life Sciences, a division of Enzo Biochem, Inc. (NYSE:ENZ), has added a novel new system to its CELLestial™ line of live cell analysis products, providing expanded capability to simultaneously image both the nucleus and the nucleolus in living cells, the Company announced today. […]

The Biopolis Shared Facilities (BSF) of the Biomedical Sciences Institutes (BMSI), Agency for Science, Technology & Research (A*STAR) has inked a Memorandum of Understanding (MoU) with Carl Zeiss MicroImaging, a global market leader in microscopy solutions and systems for research, laboratories, routine and industrial applications. The MoU formalizes a strategic partnership and collaboration which brings […]

GSR S50 & GSR F50 provide fully-automated analysis with dramatic improvements in speed, accuracy and affordability Hillsboro, Ore. –FEI Company (Nasdaq: FEIC), a leading provider of high-resolution imaging and analysis systems, today announced the release of two dedicated scanning electron microscopes (SEMs) and a new software package for automated analysis of gunshot residues (GSR). Forensic […]

Asylum Research and the Masdar Institute of Science and Technology (Abu Dhabi, United Arab Emirates) announced today that the Institute’s Laboratory for Energy and Nano-Science (LENS) has acquired Asylum’s MFP-3D Stand Alone Atomic Force Microscope (AFM) and instrumented NanoIndenter to perform research aimed at improving the efficiency of thermoelectric materials and developing non-destructive tools for […]

Correlative Microscopy in Materials Analysis JENA, Germany and OBERKOCHEN, Germany and PEABODY, Mass.–In time for the 2009 Microscopy Conference in Graz, Austria, Carl Zeiss is presenting an integrated solution for correlative microscopy in materials analysis. Core elements of the link between light microscopy and scanning electron microscopy (SEM) are the sample holder and adapter, as […]