FEI’s New Tecnai Osiris Transmission Electron Microscope Sets New Standards for Speed in Analytics Fast, Easy-to-Use S/TEM Dramatically Increases Productivity in Semiconductor Manufacturing and Materials Science Applications HILLSBORO, Ore., Jul 20, 2009 — FEI Company (Nasdaq:FEIC), a leading provider of atomic-scale imaging and analysis systems, today announced the release of the Tecnai Osiris(tm) scanning/transmission electron […]

Wageningen University Orders FEI Magellan Scanning Electron Microscope for High-Resolution Surface Imaging of Biological Materials – Netherlands-Based Lab Will Use the Magellan for Sub-Nanometer Imaging in Plant Sciences, Agro-Technology, Nutrition and Food Sciences HILLSBORO, Ore., Jul 20, 2009 — FEI Company (Nasdaq:FEIC), a leading provider of atomic-scale imaging and analysis systems, today announced the sale […]

Hitachi brings its expertise and next-generation electron microscopes to the new centre Edmonton… Alberta will be home to a new research and product development centre and state-of-the-art Hitachi microscopes thanks to support provided through the Western Economic Partnership Agreement between the governments of Canada and Alberta along with contributions from Hitachi High-Technologies. The Hitachi Electron […]

PLAINVIEW, N.Y.–Veeco Instruments Inc. (Nasdaq: VECO – News) announced today that it has completed a transaction to purchase certain assets of DayStar Technologies, Inc. (Nasdaq: DSTI – News), in order to accelerate its penetration of the rapidly growing copper, indium, gallium, selenium (CIGS) solar market. Veeco has purchased selected equipment, taken over leased facilities and […]

The New Leica TCS SP5 II – High Frame Rates, Best Resolution and Deep Tissue Imaging with Full Multi-channel Capabilities Mannheim, Germany. In close cooperation with leading research scientists, Leica Microsystems has optimized its confocal and two photon platform Leica TCS SP5 II for today’s and future challenging requirements in life science research. The new […]

Collaboration to Address Inline Elemental Analysis of Defects for the 45nm Node and Beyond ALBANY, N.Y. & HILLSBORO, Ore.–FEI Company, (NASDAQ: FEIC), a leading provider of atomic-scale imaging and analysis systems, and SEMATECH, the global consortium of chipmakers, announced today that FEI Company has joined SEMATECH’s Advanced Metrology Development Program at the College of Nanoscale […]

Advanced DualBeam Technology Accelerates Time to Data for Failure Analysis, Process Development and Process Control in Semiconductor and Data Storage Manufacturing HILLSBORO, Ore., July 13, 2009 — FEI Company (Nasdaq:FEIC – News), a leading provider of atomic-scale imaging and analysis systems, today announced the newest member of the Helios NanoLab(tm) family — the Helios NanoLab […]

Variable pressure mode extends analytical capabilities CAMBRIDGE/UK, OBERKOCHEN/Germany – Today, Carl Zeiss launches SIGMA VP, which adds variable pressure technology to the range of SIGMA field emission scanning electron microscopes (FE-SEM). Featuring the Carl Zeiss GEMINI® column, proven VP technology and a design with analytical accessories in mind, the SIGMA VP provides a comprehensive analytical […]

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, is pleased to announce the opening of their first offices in Japan together with the appointment of Nobuhiro Saito as country manager. With a growing market offering increased opportunities in Japan, JPK Instruments has opened offices in the Koto-ku […]