Collaboration closes the loop from image acquisition to image analysis Munich, Germany – October 15, 2008 – Definiens, the number one Enterprise Image Intelligence™ company, and Hamamatsu, a world-leading manufacturer of devices for the generation and measurement of infrared, visible, and ultraviolet light, today signed a partner agreement for the European market. Under the terms […]

Once again, Oxford Instruments has revolutionized EDS! Its new X-Max Silicon Drift Detector (SDD) now provides electron microscopists with the biggest area detector ever – over TEN times the solid angle of conventional EDS detectors. “This product is already changing the way people think about EDS. There is no longer a compromise between productivity and […]

Also Receives New InSight Order From Leading Korean Semiconductor Manufacturer PLAINVIEW, N.Y.–Veeco Instruments Inc. (Nasdaq: VECO), announced today that its new InSight™ 3D Automated Atomic Force Microscope (3DAFM) Platform has been accepted by a key global semiconductor customer for Critical Dimension (CD) Reference Metrology for Optical Proximity Correction (OPC) modeling. The InSight 3DAFM provides highly […]

Linguamatics Ltd, a leader in enterprise text mining for the life science and other markets, today announced that Bayer CropScience has renewed its commitment to use the I2E semantic knowledge-discovery platform to identify trends and activities in the crop protection business. Bayer CropScience has been using I2E since mid-2007, primarily for the analysis of patents […]

To better serve its customers, Nanoscience Instruments has added a unique line of SPM sensors and MEMS devices to a growing product offering. The new Nascatec line includes NSOM probes, micro/nano-grippers (tweezers), self-sensing cantilevers, AFM probes and MEMS devices. Phoenix, AZ (PRWEB) September 17, 2008 — Nanoscience Instruments, the premiere US-based distributor of nanotechnology instrumentation, […]

MENLO PARK, CA–(September 8, 2008) – SRI International has received a unique scanning electron microscope (SEM) with four secondary electron detectors and will use it to explore new application areas such as fracture mechanics, microelectromechanical systems (MEMS), coatings, ceramics, and biology. Specifically, it will be used to further develop FRASTA (Fracture Surface Topography Analysis) technology. […]

FEI Company (NASDAQ:FEIC) and Imago Scientific Instruments jointly announced today that Chalmers University has installed Imago’s LEAP(R) 3000X HR(R) atom probe in the university’s Applied Physics Microscopy and Microanalysis facility, based in Goteborg, Sweden. The atomic-scale, three-dimensional imaging and analysis provided by the atom probe complements the advanced capabilities of the institute’s existing suite of […]

DigiView IV Broadens EDAX Portfolio of X-Ray Microanalysis Instruments MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the DigiView IV, the latest generation electron backscatter detector (EBSD). “The DigiView IV is designed to serve a wide range of EBSD applications,” explains Del Redfern, Manger of Product Marketing […]

Faster analysis turn around from once a week to once per shift of feed and waste streams allows more frequent process adjustments to maximize metal recovery and economic return HILLSBORO, Ore.–FEI Company (Nasdaq: FEIC – News), a leading provider of high-resolution imaging and analysis systems, today released the MLA 600F system, a high-speed automated mineralogy […]

AACHEN, Germany–At the 14th European Microscopy Conference opening today, Bruker AXS Microanalysis announced the European launch of several new products and options for Scanning Electron Microscope (SEM) based materials analysis. Source: Bruker Corp. · CrystAlign Image: Damascene steel with clearly visible layer structure. View Multimedia Gallery The innovative new QUANTAX CrystAlignTM system for SEM-based crystallographic […]