Version 3.6.0 adds several Line Scanning options for all controllers, and the new Contour Following mode for the C3000 controller (Advanced Imaging option required).
OTTAWA, CANADA – WiLAN (TSX:WIN)(NASDAQ:WILN) announced that the Company’s subsidiary, Advanced Microscopy, Inc., has entered into a license agreement with FEI Company. The license relates to technology that provides enhanced image processing capabilities. Potential applications relate to the life sciences, material sciences, and semiconductor research. The license resolves litigation pending in the District of Delaware. […]
SANTA BARBARA, California –– Bruker’s Nano Surfaces Division today announced the release of the MultiMode 8-HR Atomic Force Microscope (AFM), which brings extensive new capabilities for nanomechanics and higher speed imaging to the world’s highest resolution, most widely-used and field-proven scanning probe microscope (SPM). The new nanomechanics features of MultiMode 8-HR enable researchers to access […]
TESCAN, a leading world manufacturer of charge particle technology, has appointed Dr. Michal Rabara as President & CEO of TESCAN USA Inc. with effect from January 1st 2016. TESCAN USA is a subsidiary of TESCAN ORSAY HOLDING, a.s. operating in the North America market. Dr. Rabara has over sixteen years of experience in charged particle […]
Auburn, MA — PI (Physik Instrumente) L.P., a leader and solution provider in motion control and positioning components and systems, has enhanced its Technical Sales Team with the recent appointment of Jess Sargent as Western Region Field Sales Engineer for OEM customers. Sargent brings a combination of knowledge in product development, technical leadership, and business […]
Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, has supplied various tensile stages for use in X-ray computerised tomography (CT) analysis to the CT Scanner Facility at Stellenbosch University in South Africa. Dr Anton du Plessis is Manager of the CT Scanner Facility […]
JEOL Ltd. (President Gon-emon Kurihara) announced a new multi-purpose transmission electron microscope, JEM-F200, to be distributed in January 4, 2016. Product development background Field emission transmission electron microscopes with a maximum accelerating voltage of 200 kV have become a multi functional high resolution analytical tool, which is used in a wide range of applications from […]
Peabody, MA – JEOL’s most recent addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, or “F2,” the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. “The combined boost in probe current from the Cold FEG with the […]
OTTAWA, CANADA – WiLAN announced that the Company’s subsidiary, Advanced Microscopy, Inc., has entered into a settlement agreement with Keyence Corporation of America. The agreement resolves litigation pending in the District of Delaware. The consideration to be paid to WiLAN and all other terms of the agreement are confidential. About WiLAN WiLAN is one of […]
The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured. OPUS™ tips are available on all standard cantilever types for all commonly used AFM applications, including […]
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IBO (Instrument Business Outlook) is a twice-monthly newsletter aimed at providing decision-makers with the latest and most complete information available on the life science and analytical instrument industry, and lab product markets. IBO delivers the latest curated industry news, information and trends, as well as SDi data and analysis to deliver the maximum in industry insight with a minimum time investment for executives and investors.
