JEOL Ltd. (President Gon-emon Kurihara) has developed a new benchtop scanning electron microscope, JCM-6000Plus NeoScope™, designed to fulfill the diversifying needs of customers and expansion of the market. Sale of the new model will start in August 2015. Product development background Scanning electron microscopes are being utilized in an expanding range of fields, such as […]

JENA/Germany, PORTLAND/USA — ZEISS Atlas 5 is a powerful hardware and software package that extends the capacity of ZEISS scanning electron microscopes (SEM) and focused ion beam SEMs (FIB-SEM). ZEISS Atlas 5 streamlines automatic image acquisition and lets users benefit from its efficient navigation and correlation of images from any source including light and X-ray […]

BRNO, Czech Republic — TESCAN ORSAY HOLDING, a.s. (TOH), a leading global instrumentation company supplier and developer of scanning electron microscopes, focused ion beams, and dual beam systems, today announced the acquisition of AppFive, LLC, an application software and technique development company in the field of charged particle optics. With the acquisition, AppFive, LLC ? […]

CAMBRIDGE/UK, JENA/Germany – ZEISS celebrates the 50th anniversary of commercial scanning electron microscopy (SEM). In 1965, the first commercial SEM called Stereoscan was built by Cambridge Instrument Company, a UK based predecessor company of Carl Zeiss Microscopy Ltd. To mark the anniversary of this very first SEM sale 50 years ago, and celebrate the contributions […]

Tokyo, Japan — Hitachi High-Technologies Corporation (“Hitachi High-Tech”) announced the release of the real-time 3D analytical FIB*1-SEM*2 composite instrument, NX9000. The new instrument features improved 3D structural analysis precision and throughput. Observation of surface properties using optical microscopes and SEMs is performed in a wide range of fields from advanced materials and semiconductor devices through […]

RALEIGH, N.C. — Protochips, Inc., (www.protochips.com) today announced the availability Aduro with Edge technology. The revolutionary new Edge technology further increases thermal accuracy and uniformity for in situ heating experiments, while dramatically reducing thermal drift. Edge technology increases the performance of the Transmission Electron Microscope (TEM) by allowing scientists to visualize materials at the nano […]

PLEASANTON, CA — The first laboratory-based diffraction contrast tomography (DCT) system for 3D grain imaging was launched today by Carl Zeiss X-ray Microscopy, a pioneer in bringing synchrotron imaging capabilities to the researcher’s laboratory. The LabDCT(TM) advanced imaging module enables a handshake between theoretical and practical worlds for predictive materials design by visualizing grain orientations […]

Researchers sometimes struggle to get good images using atomic force microscopy (AFM) because of the complexity of optimizing imaging parameters. The new GetStarted™ feature on Oxford Instruments Asylum Research AFMs eliminates this challenge, making AFM operation much simpler and more productive. GetStarted guides users through initial setup and then automatically calculates optimal imaging parameters before […]

MELVILLE, N.Y. – Nikon Instruments, Inc. is pleased to announce the inauguration of the Center of Excellence within the Department of Molecular Biology at Princeton University. Nikon has partnered with Princeton University to establish a cutting-edge microscopy facility that is mutually beneficial for both the University and Nikon. This Center of Excellence is the latest […]