Santa Clara, CA — Park Systems, a leading manufacturer of atomic force microscopy (AFM) products announces the debut of the Park XE7-CR, designed for university classrooms, research & scientific studies. Park XE7-CR is fully bundled with classroom teaching material including an AFM primer book (50 copies), a set of video files and training manuals for […]
Madison, WI — “CAMECA is very proud to introduce the LEAP 5000,” notes Dr. Tom Kelly, CAMECA Vice President for Innovation and New Technologies, and inventor of the Local Electrode™ Atom Probe (LEAP) technique. “This highly sophisticated materials analysis instrument integrates mature technologies from previous LEAP models and comes equipped with a redesigned detection system […]
HILLSBORO, Ore.– FEI is pleased to announce that researchers at the NIH-FEI Living Lab for Structural Biology have achieved breakthrough biological results, using FEI’s Titan Krios™ transmission electron microscope (TEM), to elucidate the structural mechanism by which glutamate receptors participate in the transmission of signals between neurons in the brain. Their work is described in […]
HARTFORD, Connecticut –– At the Microscopy and Microanalysis (M&M) 2014 Annual Meeting, Bruker today introduces ESPRIT DynamicS, a highly sophisticated and powerful software tool for most realistic, high resolution simulation of electron backscatter diffraction (EBSD) patterns. EBSD relies on the analysis of Kikuchi electron diffraction patterns which are obtained from microscopic regions of a sample […]
Today Johnson Matthey, Oxford University and Diamond Light Source announce the creation of a state-of-the-art materials characterisation facility at the Harwell Science and Innovation Campus. This world class site is close to both Oxford University and Johnson Matthey’s Sonning Common Research laboratories and is home to Diamond, the UK’s synchrotron science facility, where currently 24 […]
HARTFORT, CT, U.S. –– The award for excellence in microanalysis is presented at Microscopy & Microanalysis (M&M) 2014 to Ondrej Krivanek. Bruker Nano is pleased to sponsor this prestigious award again. The Peter Duncumb Award is presented for the 8th time during the M&M meeting in Hartfort, Connecticut. The most deserving winner of the 2014 […]
JENA/Germany — Today, ZEISS is introducing LSM 880 with Airyscan. The new confocal laser scanning microscope offers high sensitivity, enhanced resolution in x, y and z, and high image-acquisition speed in one system. Sensitivity, Resolution, and Speed Surveys results reveal that confocal imaging would benefit the most from increased sensitivity, resolution, and speed. Airyscan extends […]
Hillsboro, Ore., U.S. -— FEI (NASDAQ: FEIC) today announced two new products that speed up the imaging and analysis time for metals researchers and industrial failure analysis labs. The Helios™ PFIB DualBeam™, the first DualBeam within FEI’s product portfolio to include a plasma-based focused ion beam (PFIB), mills 20 – 50 times faster than gallium-based […]
Anasys Instruments reports on the recent installation of an AFM-IR system at the Corrosion & Protection Centre, part of the School of Materials at the University of Manchester for use by the group of Professor Stuart Lyon. Corrosion is of primary concern in many industrial sectors, including oil, transportation, infrastructure, nuclear, and even bio-technology. At […]
EXpressLO LLC, expert provider of focused ion beam (FIB) ex situ lift out specimen preparation solutions, has been granted patent number 8,789,826 by the U.S. Patent and Trademark Office for specimen manipulation methods incorporating a unique specimen carrier support grid design described in U.S. Patent 8,740,209. This is the second company patent for EXpressLO LLC […]
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IBO (Instrument Business Outlook) is a twice-monthly newsletter aimed at providing decision-makers with the latest and most complete information available on the life science and analytical instrument industry, and lab product markets. IBO delivers the latest curated industry news, information and trends, as well as SDi data and analysis to deliver the maximum in industry insight with a minimum time investment for executives and investors.
