SANTA CLARA, Calif. — Agilent Technologies Inc. (NYSE: A) today announced the availability of inverted light microscope (ILM) and scanning tunneling microscope (STM) capabilities for the recently introduced Agilent 7500 atomic force microscope platform. The Agilent 7500 system’s 90?m AFM closed-loop scanner achieves outstanding low-noise performance, enabling atomic-resolution imaging. The innovative design includes a built-in […]

SANTA CLARA, Calif. -– Agilent Technologies Inc. (NYSE: A) today announced that Paul Blainey, Ph.D., assistant professor in the Massachusetts Institute of Technology (MIT) Department of Biological Engineering and a researcher at the Broad Institute, is the recipient of Agilent’s sixth annual Early Career Professor Award for his work in single-cell measurement and analysis. Blainey’s […]

Norway — The Leica TCS SP8 STED 3X is the latest generation of super-resolution microscopes from Leica Microsystems, based on stimulated emission depletion (STED) technology. The super-resolution microscope system is flexible and versatile, and allows researchers to tune resolution in the lateral as well as the axial direction. The 775 nm pulsed STED laser is […]

SANTA CLARA, Calif. — Agilent Technologies Inc. (NYSE: A) today introduced its AFM-enabled Scanning Electrochemical Microscopy (SECM) mode, a seamlessly integrated technology package that enables scientists to perform scanning electrochemical microscopy on conductive and insulating samples. The system uses an Agilent atomic force microscope. This unique mode of AFM operation allows scanning electrochemical microscopy to […]

Hillsboro, Ore.—FEI (NASDAQ: FEIC) announces the availability of the NanoEx™-i/v sample holder for atomic-resolution imaging at elevated temperatures and applied electrical bias. This new solution can be integrated with FEI’s transmission electron microscopes (TEMs) to observe the effects of heating and electrical bias on nanostructured materials during in situ experiments. Materials scientists studying the structure-function […]

Buffalo Grove, IL, USA. — Leica Microsystems and MBF Bioscience today announce a partnership to offer Leica Microsystems’ microscopes fully integrated with MBF’s Neurolucida and Stereo Investigator software in the United States. This partnership gives researchers new tools to analyze tissue specimens and discover information about the brain, spinal cord, eye, and lung. “Combining our […]

NanoFocus AG, developer of optical-confocal 3D measurement technology and analysis software, presents the new µsurf expert at Control 2014 in Stuttgart, Germany. µsurf expert sets a new standard in the field of non-contact surface metrology with its high resolution sensors, linear encoders on all axes (x,y,z) and countless automation options. NanoFocus will be exhibiting in […]

Vancouver, BC Canada — PCI-AM Version 2.0 features a new edge detection technique which will enable users to work with a broader range of image types. Version 2.0 also includes more feature measurements and user settings. It can be very time consuming for engineers to measure the various features of an X-SEM image of a […]

EAST GRINSTEAD, U.K.- – A new surface analysis and microanalysis instrument demonstration facility dedicated to advancing materials science, nanotechnology, chemistry and physics has opened in East Grinstead, United Kingdom. The Thermo Fisher Scientific Nanoscale Materials Analysis Centre of Excellence is a complete renovation of the company’s previously existing East Grinstead demonstration laboratory. The facility is […]