Mannheim / Wetzlar, Germany. The introduction of the Leica TCS SP8 STED 3X in 2014 marks Leica Microsystems’ 10th anniversary of leading innovations in super-resolution technology. “Leica Microsystems was by far the first company to take the breakthrough of the diffraction limit in light microscopy and implement this in products,” says Professor Stefan W. Hell, […]

CHICAGO – Pittcon 2014 Designed to deliver rapid, research-grade imagery of molecular structures Materials scientists, engineers and academic researchers can analyze materials and accelerate their research in applications ranging from pharmaceutical formulation and life sciences to semiconductor manufacturing and geology using a new Raman imaging microscope, launched today at Pittcon. The Thermo Scientific DXRxi Raman […]

TOKYO ? The Hitachi High-Tech Group on April 1, 2014 established and began operation of Hitachi High-Technologies Mexico S.A.de C.V. (Hitachi High-Tech Mexico) in Mexico City in the United Mexican States (Mexico) as a subsidiary of Hitachi High Technologies America, Inc., which is a wholly owned subsidiary of Hitachi High-Technologies Corporation (TOKYO: 8036, Hitachi High-Tech) […]

Santa Clara, CA — Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully automated AFM solution that improves throughput of AFM defect review by up to 1,000%. The 300mm bare wafer ADR AFM is a new process for identifying defects […]

Jena, Munich — ZEISS is presenting its new iPad imaging app Labscope at Analytica 2014 in Munich. The app communicates with ZEISS microscopes that have the new version of the microscope camera Axiocam ERc 5s. How does Labscope work? The iPad accesses the microscope camera via WiFi. This allows users to view the live image […]

Andor Technology, an Oxford Instruments company and a world leader in scientific imaging and spectroscopy solutions today announces the appointment of Gary Wilmot as Managing Director. Gary replaces Conor Walsh, who will be stepping down from the role, effective 1st May. Conor Walsh joined the company in 2002 as Finance Director and Company Secretary and […]

Clarksburg, MD — The Nanotechnology Systems Division (NSD) of Hitachi High Technologies America, Inc. (HTA) is pleased to announce the appointment of Dr. Edgar Voelkl to the role of Director of Product Management. Dr. Voelkl will oversee all aspects of product marketing and management in the U.S. for HTA’s TEM and STEM product offerings. “I’m […]

Peabody, MA — JEOL and Nikon have integrated optical microscopy and field emission scanning electron microscopy in a way that enables seamless observation of the same region of interest on a sample with fast, accurate navigation. The technique, MiXcroscopy, employs the same specimen holder for both the optical microscope (OM) and the scanning electron microscope […]

Hiden Analytical announces a new range of surface and surface interface diagnostic tools. Based on the UHV Secondary Ion Mass Spectrometry (SIMS) technique the new tools provide for high performance surface elemental and contamination analysis together with depth profiling with nanometer scale depth resolution. SIMS Workstation Hiden surface diagnostics systems are designed to work well […]

Hiden Analytical announces a new range of surface and surface interface diagnostic tools. Based on the UHV Secondary Ion Mass Spectrometry (SIMS) technique the new tools provide for high performance surface elemental and contamination analysis together with depth profiling with nanometer scale depth resolution. SIMS Workstation Hiden surface diagnostics systems are designed to work well […]