alisbury, UK: NanoSight reports on how Nanoparticle Tracking Analysis, NTA, is being implemented for the characterization of various inorganic nanopowders and colloids synthesized in the Institute of High Pressure Physics at the Polish Academy of Sciences in Warsaw. The Institute of High Pressure Physics (IHPP) was founded in 1972 by the Polish Academy of Sciences. […]

Santa Clara, CA — Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces QuickStep SCM, the newest technology for high throughput in scanning capacitance microscopy (SCM). Designed to work with Park NX AFM series, the leading AFM products for researchers and engineers in the semiconductor industry, Park’s […]

HILLSBORO, Ore. — FEI (Nasdaq:FEIC) today released ExSolve™, an automated, high-throughput sample preparation workflow for transmission electron microscopy (TEM) analysis. The ExSolve wafer TEM prep (WTP) dramatically reduces the cost and increases the speed of sample preparation, providing semiconductor and data storage manufacturers with quick and easy access to the data they need to verify […]

Hillsboro, Ore. — FEI (NASDAQ: FEIC) today released the Tecnai™ Femto ultrafast electron microscope (UEM), enabling scientists to explore ultrafast events and processes that occur at the atomic and molecular spatial scale over time spans measured in femtoseconds (10-15 seconds). These include such fundamental processes as the absorption of light energy and its transformation into […]

Hillsboro, Ore. — FEI (NASDAQ: FEIC) today announced that it has completed the installation of a Tecnai Arctica™ cryo transmission electron microscope (cryo-TEM) at Nanyang Technological University (NTU) in Singapore. NTU, a young, research-intensive university, is one of the fastest rising universities in Asia. Structural biology and biomedical imaging are key research areas at the […]

Oxford Instruments, a leading supplier of microanalysis systems, has launched a new detector for Transmission Electron Microscopes (TEM) that provides a sensitivity unsurpassed in Silicon Drift Detector technology. The X-MaxN 100TLE is the perfect solution for field emission and aberration corrected TEM users working at the frontiers of nanoscience. The X-MaxN 100TLE exploits a new […]

Tokyo JAPAN — Today a joint initiative between JEOL and Gatan is announced which brings the power of Serial Block Face SEM (SBFSEM) to the JEOL family of scanning electron microscopes. JEOL is a world leader in the field of electron microscopy and, with the integration of Gatan’s 3View2.XP system will now promote the technique […]

Belfast — Andor Technology plc (AND.L, “Andor” or “the Company”), a global leader in the development and manufacture of high performance scientific digital cameras for academic, industrial and government applications, is pleased to announce that it has acquired the entire issued share capital of Spectral Applied Research Inc. for a consideration of C$11.3 million in […]