Peabody, MA — JEOL introduces a new Scanning Electron Microscope with expanded pressure range, large specimen chamber, and unsurpassed resolution for imaging and characterizing a wide variety of sample types and sizes. The JSM-IT300LV is the latest addition to JEOL’s popular series of tungsten low vacuum SEMs. This all-new design builds upon the award-winning platform […]

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on how the Laboratory for Mechanobiology and Bioengineering at Nagoya Institute of Technology in Japan use the NanoWizard®3 AFM to investigate biomaterials. Professor Shinji Deguchi leads a research group at Nagoya Institute of Technology (NITech). The Laboratory for […]

Santen is a Japanese pharmaceutical company specializing in the development and manufacturing of ophthalmic products. Santen’s products are available all over Europe and the company is the leading manufacturer of ophthalmic products in Northern Europe. Santen SAS, located in France, is the innovation center of Santen Pharmaceuticals. This is where the company incubates high technology […]

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced today their first AFM image contest. Scientists, engineers, researchers and others who work with AFM are invited to submit their favorite AFM image for consideration. Twelve winners will be selected to receive prizes and appear in the Park Systems 2014 calendar. Each of […]

Asylum Research, an Oxford Instruments company, announces the release of the new GetReal™ Automated Probe Calibration feature. With just one click, GetReal fully calibrates the atomic force microscope (AFM) probe sensitivity and spring constant, enabling more consistent, more accurate results. GetReal also protects the probe from damage that often occurs with conventional calibration methods, preserving […]

Heerbrugg, Switzerland. Leica Microsystems now provides Leica Microscope Assistant, the software module Leica LAS Store and Recall, free of charge with all coded and automated microscopes. With Leica Microscope Assistant, users can restore all settings to their microscopes to reproduce the same conditions they used to acquire an image. While Leica Application Suite (LAS) automatically […]

IntelLiDrives introduced Open Frame XY stages designed to replace manual stages found on the microscopes to provide motorized XY positioning of microscopy samples. These motorized stages enable scanning speeds of 10 mm/s. The linear feedback ensures correct positioning with a resolution of 0.1 µm and repeatability of 0.25 µm, while user programmable motion profiles allows […]

Wetzlar, Germany – Leica Microsystems’ software module Leica Application Suite (LAS) Cleanliness Expert is now available for a broader range of microscopes. More users with a wider range of requirements will benefit from the precise measurements this tool offers to the industrial sector. Leica Cleanliness Expert performs cleanliness analysis and measurements of residual dirt as […]