Oxford Instruments, a leading supplier of microanalysis systems, has launched four new modules for its AZtec Microanalysis System at M&M 2013. The new modules enable Large Area Mapping, the use of multiple X-MaxN SDD detectors on one SEM, easier re-location of samples in the microscope, and add a new ‘refined accuracy’ capability to its EBSD […]
BRNO, Czech Republic — TESCAN, a leading global supplier of scanning electron microscopes and focused ion beam workstations, and ORSAY PHYSICS, a world leader in customized focused ion beam and electron beam technology, have merged to form TESCAN-ORSAY HOLDING. Cooperating since 2007, ORSAY PHYSICS has been the sole supplier of ion beam technology to TESCAN. […]
JEOL USA will demonstrate its new JEM-1400Plus, a 120kV Transmission Electron Microscope, at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, from August 5-8. Based on the popular JEM-1400, the new TEM is making its debut in the United States at the annual meeting of the Microscopy Society of America. JEOL and Protochips have combined […]
ZEISS is introducing a new X-ray microscopy (XRM) solution that increases throughput for three-dimensional imaging at the nanoscale by up to 10 times. Using a series of technical innovations to achieve better contrast, and in turn faster acquisition, the new ZEISS Xradia 810 Ultra revolutionizes the X-ray imaging model in scientific and industrial research labs […]
Today at M&M 2013, Indianapolis, ZEISS launches the next generation EVO series for material and life science applications. Customer productivity and imaging performance are dramatically increased by the SEM’s workflow automation, beam deceleration technology and class leading HD BSE detector. EVO reduces a typical workflow from over 400 steps to just 15. Workflow productivity is […]
INDIANAPOLIS — At the Microscopy & Microanalysis 2013 Meeting (www.microscopy.org/MandM/2013), Bruker today introduces two new instruments which further expand its portfolio of high-performance tools for materials characterization in electron microscopes: • XSense™ is a novel parallel beam wavelength dispersive X-ray spectrometer (WDS) for elemental analysis on scanning electron microscopes (SEM). Specifically designed for the lower […]
Oxford Instruments plc, a leading provider of high technology tools and systems for industry and research, has announced the appointment of Gu Ran who joined the Group as President, Oxford Instruments China on 22nd July 2013. Gu Ran will be based in the factory in Shanghai, but also managing the regional offices in Shanghai, Beijing, […]
For faculty, students and researchers at the University of North Dakota in Grand Forks, ND, PetroArc International has begun development of the first high-resolution microscopic digital core library; formally named the Continental Resources High Resolution Virtual Core Library. This digital library is being created, thanks to a combination of both public and private funding, including […]
MAHWAH, NJ– EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has announced a more than 25 percent increase in the performance of its Hikari XP and DigiView EBSD cameras while maintaining their industry-best indexing quality. Hikari XP EBSD Cameras The Hikari XP camera now delivers up to 1000 patterns per second. The […]
HILLSBORO, Ore., — FEI Company (Nasdaq:FEIC), a leading instrumentation company providing imaging and analysis systems for science and industry, today announced that it has agreed to purchase nanoTechnology Systems Pty. Ltd. (NTS) of Melbourne, Australia. NTS has 15 employees primarily engaged in sales and service and has been FEI’s distributor for over 10 years. NTS […]
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IBO (Instrument Business Outlook) is a twice-monthly newsletter aimed at providing decision-makers with the latest and most complete information available on the life science and analytical instrument industry, and lab product markets. IBO delivers the latest curated industry news, information and trends, as well as SDi data and analysis to deliver the maximum in industry insight with a minimum time investment for executives and investors.
