Hitachi and Challenge Camps are holding a special program at the camp which is located at School of the Holy Child in Rye, NY to introduce students to the world of nanotechnology using Hitachi’s TM3000 Scanning Electron Microscope, which is capable of magnification of up to 30,000 times. Hitachi’s TM3000 is a highly portable, easy […]

TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations will introduce the newest generation FESEM platform MAIA at the upcoming M&M 2013 trade show in Indianapolis, IN USA, August 4 to 8, 2013. The MAIA FESEM delivers best in class high-resolution performance, ease of use by design, and unparalleled throughput […]

The National Institutes of Health (NIH) have awarded Mohammed Akhter, Ph.D., P.E., professor of medicine at Creighton University School of Medicine and director of the biomechanics laboratory at the Osteoporosis Research Center, a nearly $600,000 Shared Instrumentation Grant to install the area’s first high-resolution 3D X-ray Microscope, the Xradia MicroXCT-200. The state-of-the-art instrument, which will […]

Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces Park NX-HDM,a fully automated automatic defect review and sub-angstrom surface roughness atomic force microscopy (AFM) system for device substrates and disk media, the first metrology tool capable of providing this level of accuracy and automation. The NX-HDM system […]