Hitachi High-Technologies Corporation announced today that it had settled its dispute with FEI Company regarding Hitachi’s patents relating to Focused Ion Beam (FIB) apparatus. To resolve various patent infringement cases raised by Hitachi, FEI desired to obtain licenses under Hitachi’s FIB related patents, and Hitachi agreed to grant such licenses based on its judgment that […]

HOUSTON, — Texas Children’s Hospital is the first institution in North America to acquire a Leica Microsystems Gated Stimulation Emission Depletion (G-STED) microscope. The new microscope allows researchers to take never before seen, super-resolution photos below 40 nanometers within a cell and is the only microscope in the world that can acquire images at this […]

HILLSBORO, Ore., — FEI Company (Nasdaq:FEIC) announced today that it has reached a mutually acceptable agreement with Hitachi High-Technologies Corporation (“HHT”) to settle an ongoing dispute regarding certain HHT patents relating to focused ion beam (“FIB”) systems. In exchange for HHT’s agreement to dismiss all currently pending claims and to grant future license rights to […]

Fremont, CA — On August 10, 2012, JH Technologies, a distributor of optical and digital imaging systems, and Pacific Microsystems, a service and technical sales company, have announced a partnership designed to provide a higher level of service to customers in the Pacific Northwest. Pacific Microsystems is a new organization with an experienced staff that […]

CENTER VALLEY, Pa., — Olympus America Inc. has been named the sole North American distributor of the CV1000 Cell Voyager, an all-in-one, medium-to-high-throughput live cell imaging system from Yokogawa Electric Corporation, Tokyo, Japan. Olympus will offer the compact, easy to use, spinning-disk laser confocal microscope, which is designed for long-term time-lapse imaging, to scientists in […]

Westmont, IL — The newest version of the JEOL Benchtop Scanning Electron Microscope (SEM) the JCM-6000 NeoScope (NeoScope II), is now available through McCrone Microscopes & Accessories (MMA). McCrone Microscopes & Accessories has launched a new website at https://www.benchtopsem.com dedicated to the new NeoScope. Customers will find videos, images, and information explaining the key features […]

SANTA BARBARA, CA, – Bruker today announced the release of the Photoconductive Atomic Force Microscopy (pcAFM) module for its industry leading Dimension Icon® platform. The new accessory enables sample illumination while performing nanoscale electrical characterization. In conjunction with Bruker’s exclusive PeakForce TUNA™ technology, it uniquely enables highest resolution photoconductivity and correlated nanomechanical mapping for research […]

Phoenix, AZ– Nanoscience Instruments, Inc. announces distribution of the Imina Technologies miBot nanomanipulator in the USA and Canada. The miBot is the world’s smallest commercial manipulator and is revolutionizing the handling and sensing of diverse samples at the micro and nano scale. The miBot has already proven its unique capabilities for performing intricate tasks in […]

Scientifica has been shortlisted for The BlackBerry Growth Strategy of the Year award at this year’s National Business Awards in partnership with Orange. Uckfield-based Scientifica develops and manufactures high quality equipment for electrophysiology researchers and its export success was recently recognised with a Queen’s Award for Enterprise (International Trade 2012). Going up against the likes […]

SANTA BARBARA, CA, – Bruker announced today the release of the new PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes (AFMs). PeakForce KPFM™ utilizes frequency-modulation detection to provide the highest spatial resolution Kelvin probe data. It builds on Bruker’s exclusive PeakForce Tapping™ technology to provide directly correlated quantitative nanomechanical […]