Hillsboro, Ore. ? FEI (NASDAQ: FEIC), a leading instrumentation company providing imaging and analysis systems for research and industry, extends its leadership in the high-resolution scanning electron microscopy (SEM) market with the launch of the new Verios™ XHR SEM. The Verios provides the sub-nanometer resolution and enhanced contrast needed for precise measurements on beam-sensitive materials […]

Pittsburgh, PA – ASPEX Corporation, an FEICompany, announced the launch of EXpressx, the fastest automated bench-top SEM available. The pinnacle of truly integrated microscopy, EXpressX combines a robust scanning electron microscope, ASPEX’s own OmegaMax EDX technology and new Perception 2 operating software, all of which increase the unit’s performance and ease of use at an […]

Peabody, MA, — TMC, a unit of AMETEK Ultra Precision Technologies and a world leader in high-performance vibration control, today introduced SEMClosure™, an acoustic enclosure designed specifically for scanning electron microscopes (SEMs), at Microscopy & Microanalysis 2012 in Phoenix. With the addition of SEM-Closure, TMC now offers customers a total environmental solution to protect sensitive […]

At the Microscopy & Microanalysis conference 2012 in Phoenix, Arizona, Carl Zeiss Microscopy is introducing an extension of its Field Emission Scanning Electron Microscope (FE-SEM) platform MERLIN. Customers can now choose between the systems MERLIN Compact, MERLIN VP Compact and MERLIN and configure them individually. The Plug-and-Play feature allows the customer to add and change […]

The High Definition Field Emission Scanning Electron Microscope (FE-SEM) SIGMA HD is revealed at the Microscopy & Microanalysis conference 2012 in Phoenix, Arizona by Carl Zeiss Microscopy. SIGMA HD offers customers high resolution, fast imaging and easy sample navigation for nanoscale analytics in addition to the performance of the established SIGMA series. SIGMA HD has […]

PHOENIX —- At the Microscopy & Microanalysis (M&M) 2012 Annual Meeting, Bruker today announced the Dimension FastScan Bio™ Atomic Force Microscope (AFM), which enables high-resolution microscopy research in biological dynamics. Breakthrough innovations in the design of the FastScan Bio system have resulted in a fast scanning AFM that allows temporal investigation under physiological operating environments […]

MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced the new Octane Series Silicon Drift Detectors (SDD) for its TEAM™ EDS Analysis Systems on electron microscopes. By incorporating the latest advancements in Silicon Drift Detector technology, the Octane SDD family delivers high-quality EDS data at previously unachievable speeds. […]

Berwyn, PA, — AMETEK, Inc. (NYSE:AME) today announced the appointment of Thomas M. Montgomery as Vice President – Planning & Analysis. He most recently has served as Director, Financial Planning & Analysis in AMETEK’s Corporate Office. “I am pleased to announce Tom’s well deserved promotion to Vice President,” notes Frank S. Hermance, AMETEK Chairman and […]

A Hitachi Variable Pressure Scanning Electron Microscope (VP SEM) has been acquired by the Herbert W. Boyer School of Natural Sciences, Mathematics, and Computing at Saint Vincent College for student research in the instrument laboratory of the Sis and Herman Dupré Science Pavilion. Hitachi High Technologies America, Inc. (HTA), whose Nanotechnology Systems Division (NSD) distributes […]

Hillsboro, Ore ? FEI (NASDAQ: FEIC), a leading instrumentation company providing imaging and analysis systems for research and industry, today announced the release of the new Titan™ ETEM G2?an environmental transmission electron microscope (ETEM) that enables time-resolved, in-situ studies of processes and materials exposed to reactive gases and elevated temperatures. Developers of energy and environmental […]