JENA/Germany, SAN FRANCISCO/California/USA – Carl Zeiss has received a licence from the University of California in San Francisco (UCSF) for the commercialization of “Multidirectional Selective Plane Illumination Microscopy” (mSPIM), an advanced illumination technique for light sheet fluorescence microscopy. Light sheet fluorescence microscopy is a relatively new application of the concept of light sheet illumination in […]

Nanolane, the French company that markets truly revolutionary microscope slides with the astounding property to make conventional optical microscopes capable of imaging nano-objects is proud to announce the launch of their new Asian Demo Centre in Suzhou, China. In 2008, China overtook the United States in the number of scientific publications in the domain of […]

Edmonton, Alberta – Hitachi High Technologies and Canada’s National Institute for Nanotechnology (NINT) today opened the Hitachi Electron Microscopy Products Centre (HEMiC) and unveiled a Hitachi H-95000 environmental transmission electron microscope (E-TEM) that is the first of its kind outside of Japan. HEMiC will have two streams of activity: the provision of a wide range […]

Peabody, Mass. – A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS); Electron Energy Loss […]

TESCAN, a leading manufacturer of scientific instrumentation is celebrating its 20th year anniversary this month. Established in 1991, with the corporate headquarters located in Brno, Czech Republic, TESCAN was founded by five members of the former company TESLA. The Czech Republic has a long and rich history in electron microscopy, as the first commercially available […]

SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today introduced the first commercially available capacitance calibration standard for an atomic force microscope (AFM). The scientific solutions provider issued calibration specifications for capacitance measurements that allow quantitative assessment of material and device properties via its award-winning Scanning Microwave Microscopy Mode. Researchers from Agilent collaborated with […]

Peabody, Mass. – JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of up to 0.98 […]

ANN ARBOR, Mich. – Angelo Gaitas, President of PicoCal Inc., announces the completion of PicoCal’s SBIR Phase II NSF grant Award No. 0822810, which resulted in a number of breakthrough innovations in high throughput scanning probe microscopy, thermomechanical analysis, and mechanical properties analysis. Angelo Gaitas said that: “PicoCal Inc. continues to innovate and grow. Our […]