Surface Science

Company Announcements

Carl Zeiss designated Zollner Electronik, which manufactures and tests subsystems for electron microscopes, a Carl Zeiss SMT Supply Chain Partner.

In August, Asylum Research appointed Intertech as a distributor for Russia and Eurasia.

Carl Zeiss and Singapore’s Biopolis Shared Facilities announced a strategic partnership and collaboration.

Product Introductions

McPherson introduced the 251MX X-ray, extreme ultraviolet spectrometer for wavelength dispersive spectral measurements from 0.6 nm to 20 nm.

Agilent released the NanoSuite software package 5.0 for its nanoindentation and tensile-testing instruments.

FEI launched the Falcon Direct Electron Detector for its Titan and Tecnai transmission electron microscopes (TEMs) for the acquisition of low-noise images of delicate biological samples.

In September, FEI launched the GSR S50 and GSR F50 scanning electron microscopes (SEMs) and Magnum GSR software for automated analysis of gunshot residues.

Carl Zeiss released the Smart Particle Investigator software package, which integrates SEM control, image processing and energy dispersive X-ray analysis for particle detection and characterization.

Carl Zeiss launched a new line of corrected LIBRA 3200 TEMs: the LIBRA 200 CS TMS is based on the energy-filter version of the 200kV LIBRA with a corrector for spherical aberrations of the objective lens for resolution of 0.7 Å; and the LIBRA 200 STEM with a corrector for the condenser system for imaging in the scanning mode with resolution below 1 Å. The correctors are produced by CEOS GmbH.

Carl Zeiss introduced “Shuttle & Find,” an integrated solution for correlative microscopy for materials analysis, which connects the SteREO Discovery, Axio Imager and Axio Observer inverted light microscopes with Zeiss SEMs.

Oxford Instruments launched the X-Max large-area silicon drift detector for analytical TEMs. It has an 80mm2 sensor and can handle count rates over 100,000cps.

Oxford Instruments released the INCAmicsF+ image acquisition hardware for particle analysis.

JEOL introduced the ClairScope JASM-6200, consisting of an atmospheric SEM and an optical microscope positioned on top, allowing the imaging of the same sample area by both microscopes.

Leica Microsystems released the TCS SMD (single molecule detection) Series, which integrates hardware and software from PicoQuant with the Leica TCS SP5 II confocal system.

Bruker launched the N8 NEOS SENTERRA microanalysis system, combining Raman spectroscopy and atomic force microscopy.

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