Company Announcements

Hitachi High-Technologies filed a new suit in September 2010 in Tokyo District Court to request damages related to its charges of infringement by FEI Japan of focused ion beam patents. This suit involves different patent rights than an earlier suit (see IBO 7/15/10).

FEI is collaborating with Nanonics Imaging to explore the possibility of adding an atomic force microscope (AFM) to an FEI DualBEam focused ion beam (FIB)/scanning electron microscope (SEM) system.

Bruker named Mark R. Munch, PhD, president of Bruker Nano (see IBO 8/31/10). He was previously executive vice president of Veeco Instruments’ Metrology and Instrumentation Business. Bruker stated that the Veeco acquisition added more than 350 employees.

Nikon Instruments announced in November 2010 the start of direct sales and support for its bioscience microscopes, confocal systems and digital imaging products in New Jersey and Puerto Rico.

Carl Zeiss’s Microscopy Group reported revenue for the fiscal year ending September 30, 2010, of €397 million ($536.5 million) for growth of 9%.

Carl Zeiss named Dr. Michael Kaschke president and CEO, effective January 1. He will also continue to oversee the Medical Systems and Microscopy Groups.

In December 2010, JPK Instruments opened its first sales office in France.

Asylum Research announced that its 2010 sales set a new record, exceeding 2009 sales by nearly 20%.

Leica Microsystems will use its Leica Map surface imaging and metrology software, which is based on Digital Surf’s Mountains Technology, for its Leica Application Suite for industrial microscopes.

Product Introductions

JEOL introduced the InTouch Scope, an analytical, low-volume SEM, featuring integrated energy dispersive spectroscopy, a multitouch screen interface and an onboard turbo pump.

JEOL launched a new model of the JIB-4000 FIB milling/imaging system, featuring high-speed fabrication.

Leica Microsystems released the HCS A package, based on the LAS AF Matrix M3 software, which extends its automated high-content screening solution to cover applications on widefield fluorescence systems.

Nikon Instruments launched the C2 Confocal Laser Point Scanning Microscope, featuring four-channel confocal fluorescence imaging.

Bruker introduced the PeakForce TUNA module for its AFM systems, which enables very high resolution nanoelectrical characterization on fragile samples.

In December 2010, FEI launched a Magellan SEM system optimized for life science imaging. It includes a fully integrated workflow for cryogenic sample preparation and handling.