Surface Science: Product Introductions

SII NanoTechnology introduced the L-trace II large-stage unit SPM, featuring a new accurate scanner and a standard closed loop scanner, and the S Image multifunction-unit SPM, featuring a new low-coherence optical head.

FEI launched the Quanta 3D FEG SEM/FIB (Focused Ion Beam) Dual Beam, featuring three operating modes, for advanced three-dimensional nanoscale characterization, prototyping and analysis.

FEI combined its Quanta SEM with JKTech’s Mineral Liberation Analyzer software to provide automated analysis for minerals exploration and processing.

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