PeakForce SECM Mode Enables Previously Unobtainable Electrochemical Information

SANTA BARBARA, CA – Bruker’s Nano Surfaces Division today announced the release of scanning electrochemical microscopy (SECM) capability for its Dimension Icon® atomic force microscope (AFM) platform. Utilizing a proprietary probe design, Bruker’s new PeakForce SECM™ mode controls nanoelectrode tip position and tip-sample interaction with unprecedented precision to provide simultaneous capture of topographical, electrochemical, electrical, and mechanical maps. This capability provides access to previously unobtainable nanoscale observation of redox reactions and their kinetics. Now researchers are able to address vital evolution of materials for energy, environment, and biochemical sensors.

“Our customers have been consistently imaging at very high resolution with the new nanoelectrodes on the Dimension Icon AFM,” said Teddy Huang, Ph.D., Senior Applications Scientist at Bruker Nano Surfaces Division. “For the firs