MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, continues to lead the industry with its recent release of OIM™ 6.0-the first microanalysis package to be written for 64 bit processor and Microsoft® Windows 7 compatibility with datasets reaching >40 million data points.

OIM™ software offers easier access to the most commonly used functions along with one button analysis. Among the latest features incorporated into OIM™ 6.0 are expanded QuickGen and Template functionality, full-image area mapping, easier data rotations, interactive page colors, and password protected system level settings. OIM™ 6.0 also offers improved user access with advanced visualization tools, an interactive status bar, and data processing log to automatically record post processing performed on datasets.

In addition, improvements to the patented Chi-Scan technology, a combined EDS-EBSD tool for multiphase analysis developed by EDAX, offers enhanced phase differentiation, especially for nanoscale measurements. Coupled with the latest features in OIM™ 6.0, EDAX offers the most comprehensive software package available for EBSD.

EDAX is an acknowledged leader in Energy Dispersive Microanalysis, Electron BackScatter Diffraction and X-ray Fluorescence Instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials and ceramics markets. Since 1962, EDAX has used its knowledge and experience to develop the latest silicon drift detector technology, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division-a division of AMETEK, Inc., a leading global manufacturer of electronic instruments and electromechanical devices with 2009 sales of $2.1 billion.