MAHWAH, NJ – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched its new Velocity™ EBSD camera, which offers high-speed EBSD mapping with the highest indexing performance on real-world materials.

Powered by a CMOS sensor, the Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.

The Velocity™ EBSD camera can be integrated with compatible EDAX EDS detectors to provide an analytical system for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. When combined with ChI-Scan™ analysis, this results in useful integrated data for accurate phase differentiation.

This new addition to the EDAX portfolio of EBSD cameras, offers users a further option for high-speed mapping and accurate indexing needed to resolve crystallographic microstructures and help solve materials characterization challenges quickly and easily.

For further information, please visit www.edax.com/velocity or email EDAX at [email protected].

About AMETEK EDAX

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.