The Elite T Ultra is ideal for compositional analysis and in-situ electron microscopy in the STEM. Previously, rapid elemental mapping was challenging due to the low signal levels generated from thin samples in the STEM. However, utilizing a proprietary windowless 160 mm2 x-ray sensor, the Elite T Ultra now delivers outstanding detection efficiencies to address a broader range of elements and accelerate compositional mapping during material characterization studies.

“The Elite T Ultra offers exceptional data collection rates and sensitivity to light and heavy elements,” said Dr. David Stowe, Senior Product Manager, Gatan. “Using a sensor 80% larger than conventional large-area detectors while maintaining a compact sensor design with an unobstructed high solid collection angle (up to 2.3 steradian), the Elite T Ultra detector can be inserted close to the sample, maximizing the collection of x-rays emitted by your sample.”

“Utilizing eaSI™ technology, the Elite T Ultra system can record synchronized STEM signals including EDS, electron energy loss spectroscopy, or EELS, 4D STEM, and cathodoluminescence from multiple detectors simultaneously,” commented Narayan Vishwanathan, Vice President and Business Unit Manager of AMETEK Electron Microscopy Technologies. “It links multi-dimensional datasets seamlessly to give users a complete view of their specimen in conventional and in-situ analyses.”

For further information, visit www.gatan.com.