New high resolution, high transmission and high sensitivity MAX SIMS Quadrupole Mass Spectrometer for static and dynamic SIMS, SNMS and depth profiling.

Henniker Scientific Ltd. announce the release of the Extrel MAX SIMS Quadrupole Mass Spectrometer.

The MAX-SIMS quadrupole mass spectrometer is a high performance bolt-on instrument for static SIMS, dynamic SIMS, SNMS and depth profiling applications and is ideal for surface analysis and materials characterisation of a wide range of samples including those found in photovoltaics, metallurgy and semiconductor and thin-film studies.

Featuring our highest performance 19mm triple quadrupole mass filter with up to 4000amu mass range, low noise conversion dynode ion counting detector and ion sampling optics, the MAX SIMS delivers exceptional transmission, resolution and sensitivity characteristics in a simple to use, bolt-on instrument.

The instrument also features a high sensitivity quadrupole deflector ionizer for SNMS and ion energy measurement in ISS and MARISS experiments under full software control of the comprehensive Merlin data acquisition system. Energy resolution is less than 0.5eV with the high transmission quadrupole deflector.

The instrument can is totally UHV compatible and bakeable to 250degC.

Further details are available at http://www.henniker-scientific.com

About Henniker Scientific Ltd: Henniker Scientific supply components, instruments & complete systems for a wide range of vacuum, thin film growth & deposition, UHV surface analysis, plasma treatment, plasma characterisation & gas analysis applications. Our products make up one of the largest ranges of quadrupole mass spectrometers, surface analysis instruments and plasma diagnostic tools from any single supplier. These form the heart not only of our own custom built systems, but those of many other equipment manufacturers too.

From UHV transfer and sample heating/cooling stages to bespoke cluster deposition systems, we can build a key part, if not all of your next research system.