Hiden is pleased to announce they will be exhibiting the New Compact SIMS, a design

breakthrough for surface analysis, at ARABLAB 2015 23rd – 26th March, Dubai UAE. Visit us on

Booth 1011. The Compact SIMS tool is designed for fast and easy characterisation of layer

structures, surface contamination and impurities with sensitive detection of positive ions being

assisted by the oxygen primary ion beam and provides isotopic sensitivity across the entire periodic

table. The ion gun geometry is optimised to be ideal for nanometre depth resolution and near

surface analysis.

A rotary carousel enables 10 samples to be simultaneously loaded for measurement into the drypumped

vacuum chamber. The instrument has a small footprint and is exceptionally easy to use, it

boasts the same control software and ion gun system as the fully featured Hiden SIMS Workstation

family, providing depth profiles, 3D and 2D images and mass spectral data. The MAXIM-600P

detector is based around the highly reliable Hiden 6mm triple quadrupole mass filter with pulse ion

detection. An electron gun option is available for analysis of insulating samples.

In addition to SIMS, the Compact SIMS has an SNMS facility that is useful for quantification of high

concentration elements, such as alloys.

Applications:

– Solar cells

– Glass coatings

– Metallic thin films

Features:

– Small footprint

– Easy user friendly layout

– Positive SIMS and SNMS

– Depth Profiling

– 3D characterisation and imaging

– Mass spectra

– Isotopic analysis

– Analysis on the nanometre scale

For further information on this or any other Hiden Analytical products visit the Hiden Analytical

Booth 1011 at ARABLAB 2015 or contact Hiden Analytical at: info@hiden.co.uk or visit the main

website at www.HidenAnalytical.com.

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