Release of a New Electron Microscope JEM-2100Plus
JEOL Ltd. (President Gon-emon Kurihara) announced a new 200 kV transmission electron microscope incorporating a thermionic-emission electron gun, JEM-2100Plus, to be distributed in June 2015.
Product development background
Transmission electron microscope (TEM) has long been a tool essential for micro structure evaluation. The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.
Main Features
Designed to ease of operation
64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation.
Advanced integration
The TEM Center allows the user to control optional accessories such as high resolution camera and scanning image (BF/DF) observation device through intuitive user-system interaction.
A complete range of automated functions
The JEM-2100Plus comes with a complete range of automated functions, including auto focus, auto contrast/brightness, auto exposure, auto montage, drift compensation, and stage navigation.
Image view/edit software
Viewer software supports off-line image viewing and editing.
Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
Main Specifications
Maximum accelerating voltage 200kV
Guaranteed resolution 0.14 nm (TEM lattice image)
Magnification x30 to x800,000
The JEM-2100Plus can be configured to support a variety of applications from cryo TEM
to ultra high resolution imaging.
JEM-2100Plus

