New Quantitative AFM Mode for High-Resolution Material Mapping

PLAINVIEW, N.Y.–Veeco Instruments Inc. (Nasdaq: VECO – News), a leading provider of instrumentation to the nanoscience community, today introduced HarmoniXTM, a powerful new atomic force microscope (AFM) technique for high-resolution nanoscale imaging and analysis. Veeco’s HarmoniX Nanoscale Material Property Mapping enables AFM users to simultaneously, and in real-time, acquire high-resolution images as well as high-resolution, quantitative material property maps. The HarmoniX mode is now available on all Veeco scanning probe microscopes that are powered by the new NanoScope® V controller, including the MultiMode® V, DimensionTM V, and BioScopeTM II.

David Rossi, Vice President, General Manager of Veeco’s Nano-Bio AFM Business, commented, “HarmoniX is a significant breakthrough in SPM technology and opens the door to quantitative material property characterization at speeds and levels of resolution previously impossible. Our product scientists and engineering team collaborated with Dr. Ozgur Sahin, of the Rowland Institute at Harvard, to develop and bring this new patented technique to market. Thousands of publications have referenced Veeco’s AFMs, and we believe that HarmoniX, available exclusively from Veeco, represents a major leap forward to enable our customers’ further scientific discoveries.”

Dr. Bede Pittenger, Veeco Development Scientist, added, “HarmoniX provides an AFM user the ability to simultaneously capture quantitative maps of material properties, such as elasticity, adhesion, dissipation and peak force. The HarmoniX technique renders these maps at speeds that are orders of magnitude greater than currently-available force techniques, with the same level of high resolution our customers are accustomed to with Veeco’s TappingModeTM.”

About HarmoniX

Veeco’s NanoScope V microscope controller and proprietary probes provide the speed, signal levels, and processing power necessary to render high-resolution data never before seen in real time. HarmoniX acquires real-time force curves by measuring the cantilever’s torsional and flexural motion each time the AFM tip interacts with the surface in TappingMode. Proprietary algorithms instantly calculate the force curves that occur when the tip taps the surface, and analyze them to obtain multiple sample characteristics. These material properties are then rendered in image maps that correlate to the sample topography image. These maps are quantitative and directly traceable to the Elastic Modulus of the sample being imaged. To learn more about HarmoniX, and to see a video of how it works, please visit http://www.veeco.com/harmonix-pr.

About Veeco

Veeco Instruments Inc. manufactures enabling solutions for customers in the HB-LED, solar, data storage, semiconductor, scientific research and industrial markets. We have leading technology positions in our three businesses: LED & Solar Process Equipment, Data Storage Process Equipment, and Metrology Instruments. Veeco’s manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the U.S., Europe, Japan and APAC. http://www.veeco.com/

To the extent that this news release discusses expectations or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the risks discussed in the Business Description and Management’s Discussion and Analysis sections of Veeco’s Annual Report on Form 10-K for the year ended December 31, 2007 and in our subsequent quarterly reports on Form 10-Q, current reports on Form 8-K and press releases. Veeco does not undertake any obligation to update any forward-looking statements to reflect future events or circumstances after the date of such statements.

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