FOSS NIRSystems introduces the NIRS DS2500 analyzer
July 30, 2012
FOSS NIRSystems is pleased to announce the introduction of the FOSS NIRS™ DS2500 analyzer. With the NIRS DS2500, near infrared analysis has taken yet another step towards ultimate performance. Combining exceptional accuracy across a broad wavelength range of 400 to 2500 nm, this instrument brings the future of near infrared technology one step closer. Designed [...]
July 30, 2012
OMAHA, Neb. – Transgenomic, Inc. (OTC/BB: TBIO) and the Medical College of Wisconsin (MCW) today announced a collaboration agreement under which Transgenomic will offer next-generation genetic testing services performed at the MCW Clinical Sequencing Program. These services will initially include Transgenomic’s NuclearMitome Test for mitochondrial disorders. Under the agreement, the MCW laboratory will become the [...]
Roper Industries To Acquire Sunquest Information Systems
July 30, 2012
SARASOTA, Fla., -- Roper Industries, Inc. (NYSE: ROP) today announced that it has entered into a definitive agreement to acquire Sunquest Information Systems, Inc., the leading provider of diagnostic and laboratory software solutions to healthcare providers, in an all cash transaction valued at $1.415 billion, including $25 million in cash tax benefits. Headquartered in Tucson, [...]
FEI Announces New Verios Extreme High Resolution SEM
July 30, 2012
Hillsboro, Ore. ? FEI (NASDAQ: FEIC), a leading instrumentation company providing imaging and analysis systems for research and industry, extends its leadership in the high-resolution scanning electron microscopy (SEM) market with the launch of the new Verios™ XHR SEM. The Verios provides the sub-nanometer resolution and enhanced contrast needed for precise measurements on beam-sensitive materials [...]
Bruker Announces Dimension FastScan Bio AFM for Biological Dynamics
July 30, 2012
PHOENIX ---- At the Microscopy & Microanalysis (M&M) 2012 Annual Meeting, Bruker today announced the Dimension FastScan Bio™ Atomic Force Microscope (AFM), which enables high-resolution microscopy research in biological dynamics. Breakthrough innovations in the design of the FastScan Bio system have resulted in a fast scanning AFM that allows temporal investigation under physiological operating environments [...]
Cole-Parmer Releases Biofuel Series of Catalogs
July 30, 2012
Vernon Hills, IL -- With the release of Bioethanol, the third in a series of Biofuel catalogs from Cole-Parmer, customers have resources to choose testing equipment that helps them meet ASTM standards. Along with key testing products, the catalogs detail which specifications of ASTM apply and what is needed to pass the test methods. The [...]
TMC Introduces SEM-Closure™ For Total Environmental Protection Of Scanning Electron Microscopes
July 30, 2012
Peabody, MA, — TMC, a unit of AMETEK Ultra Precision Technologies and a world leader in high-performance vibration control, today introduced SEMClosure™, an acoustic enclosure designed specifically for scanning electron microscopes (SEMs), at Microscopy & Microanalysis 2012 in Phoenix. With the addition of SEM-Closure, TMC now offers customers a total environmental solution to protect sensitive [...]
Carl Zeiss reveals High Definition FE-SEM SIGMA HD
July 30, 2012
The High Definition Field Emission Scanning Electron Microscope (FE-SEM) SIGMA HD is revealed at the Microscopy & Microanalysis conference 2012 in Phoenix, Arizona by Carl Zeiss Microscopy. SIGMA HD offers customers high resolution, fast imaging and easy sample navigation for nanoscale analytics in addition to the performance of the established SIGMA series. SIGMA HD has [...]
LECO Introduces Automated Shuttle Loaders for CS844 Series Analyzers
July 30, 2012
St. Joseph, Mich.—LECO’s CS844 Series Carbon/Sulfur Analyzer is now available with optional shuttle loaders, providing seamless, automated sequential or non-sequential processing of pre-weighed samples of inorganic materials such as primary steels, ores, and finished metals. Customers can choose either the Shuttle10 Loader, which features a single carousel that holds ten samples, or the Shuttle60 Loader, [...]
EDAX Introduces Octane Series SDDs for Fast, High-Quality EDS Microanalysis
July 30, 2012
MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced the new Octane Series Silicon Drift Detectors (SDD) for its TEAM™ EDS Analysis Systems on electron microscopes. By incorporating the latest advancements in Silicon Drift Detector technology, the Octane SDD family delivers high-quality EDS data at previously unachievable speeds. [...]
