Industry Press Releases

Rolf Hansen Ph.D. Has Been Appointed as Director Marketing & Sales of Kreatech Diagnostics

August 2, 2010

Amsterdam - We are excited to welcome Rolf Hansen to the Kreatech team. His broad experience within the life sciences industry will enable Kreatech to further focus on serving our customers worldwide with a broad portfolio of innovative Molecular Diagnostics and labeling tools. Rolf will be responsible for leading Kreatech’s marketing and sales activities and [...]

U.S. Department of Agriculture and DuPont Collaborate on New Test for Hard to Detect Foodborne Pathogens

August 2, 2010

Wilmington, DE - DuPont and the U.S. Department of Agriculture have agreed to collaborate on the development of a new test for detecting hard-to-identify strains of toxin-producing E. coli that are not currently regulated and have been causing increased instances of food contamination and illness. DuPont was among the first to develop tests for E. [...]

Shimadzu is Releasing a New Energy Dispersive X-ray Fluorescence Spectrometer

August 2, 2010

New energy dispersive X-ray fluorescence spectrometer allows for easier and quicker screening of hazardous elements regulated by RoHS/ELV directives. Use of a liquid nitrogen-free detector reduces costs and makes maintenance easier. Shimadzu is releasing a new energy dispersive X-ray fluorescence spectrometer designed specifically for RoHS/ELV screening inspections (model name: EDX-LE). The model uses an electronic [...]

QinetiQ North America Introduces Spectroil Q100 Oil Analysis Spectrometer

August 2, 2010

McLean, Va. - QinetiQ North America, a global developer of innovative technology solutions, today announced that wholly owned subsidiary, Spectro Inc., is introducing the Spectroil Q100 Oil Analysis Spectrometer, an analytical instrument that detects and quantifies metals in used (in-service) oils and hydraulic fluids that are indicative of an abnormal condition. Spectro Inc. customers will [...]

IBM and University of Aberdeen Collaborate to Identify Molecules from the Deep Sea

August 2, 2010

For the first time, atomic force microscopy helps scientists reveal the exact chemical structure of a natural compound Using this fast and accurate technique could open new possibilities in drug discovery and treatments Compound was extracted from a mud sample taken from the Mariana Trench, 10,916 meters (35,814 feet) below sea level ABERDEEN, Scotland & [...]

FEI Introduces Nova NanoSEM 50 Series

August 2, 2010

New Family of Electron Microscopes Combines Ultra-High Resolution and Analytical Performance for the Widest Range of Materials HILLSBORO, Ore. - FEI Company (Nasdaq:FEIC), a leading scientific instrumentation company providing electron microscope systems for nanoscale applications across many industries, announced today the availability of its new Nova(TM) NanoSEM 50 Series of ultra-high resolution scanning electron microscopes [...]

James (Jim) Pouquette Joins Carl Zeiss

August 1, 2010

Former FEI Executive becomes Senior Vice President Sales of Nano Technology Systems division of Carl Zeiss PEABODY, Massachusetts, USA - Carl Zeiss today announced that Emile James (Jim) Pouquette, a former FEI Executive, has joined Carl Zeiss SMT North America as senior vice president sales. Pouquette, an honors graduate in Business Administration from California State [...]

Portable yet Highly Sensitive, Prototype Heavy Metal Measurement Device Completed

August 1, 2010

Industry-Academia Joint Development: Trace Heavy Metal Measurement Device Incorporating Diamond Electrodes Horiba, Ltd., in collaboration with Professor Einaga at Keio University, has developed a portable measurement device incorporating diamond electrodes for trace heavy metal ions. This measurement equipment takes only about five minutes to measure elements such as cadmium and arsenic contained in industrial wastewater [...]

Hitachi High-Technologies Launches the SU8040

July 30, 2010

Smooth Operating even at high magnification observation Hitachi High-Technologies Corporation (TOKYO:8036) has developed the SU8040, a new type of Field Emission Scanning Electron Microscope (FE-SEM) that features a newly developed Regulus (REGULated Ultra Stable) Stage. The SU8040 will be introduced on August 1. Now FE-SEM becomes an indispensable tool for semiconductor industry and cutting-edge nanotechnology [...]

Exciting Nanofabrication Capabilities Are Now Available on Carl Zeiss Helium Ion Microscope

July 30, 2010

A new, integrated gas injection system on the ORION® Plus Helium Ion Microscope delivers superior nanofabrication, deposition and etch. PEABODY, Massachusetts, USA - Carl Zeiss today introduced a new Gas Injection System for the ORION® Plus Helium Ion Microscope. The combination of a sub-nanometer (less than 0.35nm) probe of inert gas ions with a small [...]

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