JEOL Ltd. (President Gon-emon Kurihara) announces the release of the JXA-8530FPlus Electron Probe Microanalyzer (EPMA) equipped with the In-Lens Schottky Plus FEG (field emission gun), to be distributed in January 5, 2017. Product development background JEOL commercialized the world’s first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various […]