The University of Michigan in Ann Arbor has named Olympus America Inc. as a key partner for its Lurie Nanofabrication Facility (LNF). Olympus will provide researchers with advanced microscopes, camera equipment, and software to meet a wide variety of optical imaging, analysis, characterization, measurement, and inspection needs. The LNF is also known as the Michigan […]

Bitplane Zurich – Bitplane, a world leading creator and supplier of 3D and 4D image processing, analysis and visualisation software, today announce the launch of their new Imaris 7.3 software. Imaris 7.3 brings significant enhancements to pivotal features within several Imaris modules enabling users to perform increasingly more challenging image analyses. New capabilities include novel […]

Peabody, MA – Scientific instrumentation is typically housed in an enclosed room, with just enough access for operation or service. The heat generated from equipment, personnel entering and exiting the room, and the enclosed facility itself can all affect the performance of sensitive instrumentation. To help ensure optimum instrument performance and maintain a consistently cool […]

Hitachi High-Technologies Corporation (TOKYO: 8036, Hitachi High-Tech) established a development center for analyzers at Hitachi Instruments Dalian Co. Ltd., a local production subsidiary in Dalian, China. The new center is Hitachi High-Tech’s first development site outside of Japan. On June 23, 2011, Hitachi High-Tech held an opening ceremony to mark the start of operations at […]

Jena, Germany / Besançon, France – Carl Zeiss and Digital Surf announce the signing of an agreement enabling Carl Zeiss to provide ConfoMap® software. ConfoMap® is a surface imaging and analysis software for confocal microscopes and compound microscopes for topographical research. “Carl Zeiss confocal microscopes provide strong support for the development of new materials and […]

Phoenix, AZ – Nanoscience Instruments announces an integrated 3D optical microscope and atomic force microscope (AFM) system. The new system combines a compact Nanosurf LensAFM with an advanced Zeta Instruments optical profiler. This unique pairing provides an extremely wide range of metrology capabilities, unmatched by any other instrument. The LensAFM builds on Nanosurf’s long history […]

BANNOCKBURN, IL – Meyer Instruments will no longer be representing Leica Microsystems as a regional dealer in the states of Oklahoma, Texas, Arkansas, Mississippi and Louisiana. Leica Microsystems will have direct operation and continue a strong presence and responsiveness to this important region of the U.S., offering high-level, professional expertise, and quality products to their […]

Raleigh, NC – Protochips (https://www.protochips.com), a company specializing in revolutionary products for in situ electron microscopy, today announced that PicoScientific has been named to represent the AduroTM and PoseidonTM systems for in situ microscopy. PicoScientific is the latest addition to a robust distributor network as part of a strategic initiative to provide customized solutions. Bryan […]