Acquisition Transforms Bruker Advanced Supercon Business into Global Leader in Superconducting Devices, Superconductors and Advanced Technologies for Alternative Energy Research and Next-Generation Energy Infrastructure. BILLERICA, Mass.–Bruker Advanced Supercon, Inc. (Bruker) today announced that it has closed the acquisition of the research instruments portion of Varian Medical Systems’ ACCEL Instruments GmbH subsidiary in Bergisch-Gladbach, Germany. Varian […]

The Fibermetric system delivers statistically valid data in minutes to improve fiber and filter material development and manufacturing Hillsboro, Ore./March 31, 2009―FEI (Nasdaq: FEIC), a leading provider of electron imaging and analysis systems, today announced the Fibermetric™ system powered by the Phenom™ personal electron microscope. The Fibermetric system is designed to discover and quantify the […]

CENTER VALLEY, PA., March 30, 2009 – Olympus now offers powerful Visiomorph™ image analysis as part of a whole slide imaging software bundle, among new offerings in an array of histoinformatics software products designed for microscope users interested in high-performance image analysis, stereology, automated imaging and data management. Visiomorph™, Microimager™ Automated Software and the other […]

Wetzlar, Germany. For the first time in its history, Leica Microsystems’ annual sales volume for 2008 exceeded the billion US dollar mark, reports the international high-tech microscope and scientific instrument manufacturer and distributor, headquartered in Wetzlar. “Over the last two years, we have seen a dramatic increase in the demand for our products throughout the […]

AURIGA™ CrossBeam® Workstation Provides Advanced Analytics, Precise Processing of Samples, Unique Imaging, a Future-Assured Upgrade Path and More OBERKOCHEN/Germany – March 25, 2009. Today, Carl Zeiss SMT introduced its newly developed AURIGA™ CrossBeam® (FIB-SEM) work-station. As one of the pioneers in developing this class of Information beyond resolution instruments, and with more than 8 years […]

The world’s first metallic needle AFM probes are now available from Nanoscience Instruments. Featuring a unique combination of high aspect, consistent geometry, and high conductivity, metallic needle probes are enabling new applications in nanoscale sensing and manipulation. Phoenix, AZ (PRWEB) March 24, 2009 — Nanoscience Instruments, a premier distributor of nanotechnology instrumentation and supplies, today […]

Will Sell Microscope and Imaging Systems Directly in New England and Upper Midwest CENTER VALLEY, PA., March 23, 2009 – Olympus America Inc. has announced an asset purchase agreement with Optical Analysis Corporation, a distributor and value added reseller of scientific instrumentation and systems based in Nashua, NH. Effective April 1, Olympus will have purchased […]

The Quanta 50 Series redefines the versatility of SEMs Hillsboro, Ore./March 9, 2009―FEI Company (Nasdaq: FEIC), a leading provider of atomic-scale imaging and analysis systems, today released the Quanta™ 50 Series scanning electron microscope (SEM), which offers an outstanding combination of performance and versatility over an extraordinary range of samples. The Quanta 50 Series will […]

CHANDLER, Ariz., March 9, 2009. Agilent Technologies Inc. (NYSE: A) today announced the addition of several new capabilities to its 5600LS, a high-resolution atomic force microscope (AFM) that uses a fully addressable 200mm x 200mm stage and a low-noise AFM design to image both large and small samples. For ultimate flexibility, the 5600LS can accommodate […]

New SPECTRA detector provides ability to characterize bulk materials at the nanometer scale, adding even more unique information about the sample. PEABODY/ Massachusetts/USA – March 9, 2009. Carl Zeiss SMT, a leading global provider of optical and particle-beam inspection, analysis and measuring equipment, today introduced a powerful new detector for the ORION® Plus helium-ion-microscope. Called […]