CNProbes, an Emerging Nanotech Solutions Provider, Has Executed an Agreement with a Leading MEMS Foundry (Contract Manufacturer) This Agreement Puts CNProbes Closer to Ramping up Full-Scale Production and Launch of CNProbes’ Flagship Product, a Carbon Nanotube Probe Tip for Use in the Atomic Force Microscope (AFM) Last update: 9:06 a.m. EDT July 23, 2008 SEATTLE, […]

Higher-quality results in hours (not days) speed process development and enhance yields FEI Company (Nasdaq: FEIC), a leading provider of atomic-scale imaging and analysis systems, today announced the Ultimate Throughput™ and Ultimate Imaging™ Connectivity Solutions. By accelerating and improving the quality of preparation, imaging and analysis of the ultra-thin samples required for transmission electron microscopy […]

Oxford Instruments NanoAnalysis introduces ThinFilmID for the in-situ measurement of composition and thickness of thin films down to 1nm in the SEM. ThinFilmID uses Energy Dispersive X-ray Spectrometry (EDS) to measure the composition and thickness of layers in a thin film structure. This technique has a unique combination of advantages that offer real benefits to […]

Nikon Instruments Inc. (https://www.nikoninstruments.com/) announced its new SMZ-445/460 stereoscopic zoom microscopes, combining a very small size with high performance at a low cost for the Industrial and OEM markets. These microscopes allow observation of a wide range of applications, from routine quality control to semiconductor probing OEM applications. The SMZ-445, with 0.8x to 3.5x zoom […]

New Magellan SEM First to Enable Rapid 3D Surface Imaging at Sub-Nanometer Resolution HILLSBORO, Ore., Jul 07, 2008 — With its announcement today of the Magellan(TM) Family, FEI Company (Nasdaq:FEIC) introduced a new class of instruments called extreme high-resolution scanning electron microscopes (XHR SEMs). The Magellan XHR SEM allows scientists and engineers to quickly see […]

The Leica M205 FA Stereomicroscope with FusionOptics™ Technology Bannockburn, Illinois. Leica Microsystems introduces the Leica M205 FA, the world’s first automated fluorescence stereomicroscope with a fully apochromatically-corrected 20.5:1 zoom. The Leica M205 FA overcomes the previous limits of optical resolution with Leica Microsystems’ latest innovation: FusionOptics. The design principle of the Leica M205 FA is […]

PLAINVIEW, N.Y.–Veeco Instruments Inc. (Nasdaq: VECO – News), a leading provider of instrumentation to the nanoscience community, today introduced the “Veeco Labs Research Grant Program,” designed to stimulate the generation of new scientific investigation for researchers in the atomic force microscopy community. This grant program will sponsor selected early adopters of current and future Veeco […]

Acquisition Strengthens Agilent’s Nanomeasurements Portfolio SANTA CLARA, Calif.–Agilent Technologies Inc. today announced that it has acquired the Nano Instruments business unit of MTS Systems Corp. The acquisition will strengthen Agilent’s portfolio of instrumentation for imaging, characterizing and quantifying nanomechanical material properties. Financial details were not disclosed. Based in Oak Ridge, Tenn., Nano Instruments is a […]

With three newly defined Strategic Business Units, a new Managing Director and an expanded product portfolio, the Life Science Division of Leica Microsystems is reinforcing its world market position in the life sciences. Dr. Stefan Traeger, the newly appointed Managing Director of Leica Microsystems CMS GmbH (Wetzlar and Mannheim), announced that in future the Life […]

Titan ETEM Allows Researchers to See Chemistry and Nanoscale Catalysis at the Atomic Level HILLSBORO, Ore.–FEI Company (NASDAQ:FEIC – News), a leading provider of high-resolution imaging and analysis systems, today announced the release of the Titan™ 80-300 environmental transmission electron microscope (ETEM). The Titan ETEM is the premier solution for chemical research at the atomic […]