Surface Science

Company Announcements

Intellection appointed Beamtech Nordiska AB as its exclusive distributor for Sweden, Scandinavia and the Baltic States.

Leica Microsystems CMS GmbH named Dr. Stefan Traeger managing director in June.

Leica Microsystems CMS GmbH’s Life Science reorganized into three strategic business units in June: Life Science Research, Clinical Imaging and Nanotechnology.

FEI will market and distribute Max Planck Institute’s correlative microscopy solution, including a cryo-correlative stage, for acquiring transmission electron microscope (TEM) images of molecular entities found using optical microscopy techniques.

Product Introductions

SII NanoTechnology introduced the ULTRA plus scanning electron microscope (SEM), developed and manufactured by Carl Zeiss SMT GmbH, which eliminates charges on nonconductive specimen.

Thermo Fisher Scientific launched the Thermo Scientific NORAN System 7 energy dispersive X-ray spectroscopy (EDS) microanalysis system, featuring Direct-to-Phase software.

FEI introduced the Titan 80-300 environmental TEM, featuring the ability to deliver imaging with gas pressures in the sample chamber as high as a few percent of atmospheric pressure. Shipments will begin in the first quarter of 2009.

FEI introduced the Ultimate Throughput and Ultimate Imaging Connectivity Solutions for sample preparation for TEM imaging for semiconductor manufacturing.

Agilent introduced the Agilent 5600LS atomic force microscope (AFM), featuring a fully addressable 200 mm x 200 mm stage to image large samples in air or smaller samples in liquid.

Agilent released a scanning microwave microscopy mode for its 5400 and 5600LS AFMs for complex, calibrated electrical and spatial measurements.

Oxford Instruments NanoAnalysis introduced ThinFilmID for the in situ measurement of composition and thickness of thin films down to 1 nm in SEM using EDS.

Bruker AXS released the QUANTAX CrystAlign system for SEM-based crystallographic analysis via electron backscatter diffraction.

ASPEX launched the Rx microanalysis system, an integrated SEM and EDS solution for microcontamination quality control on the pharmaceutical production floor.

JEOL USA introduced the MultiBeam SEM/focused ion beam JIB-4600F, with the ability to simultaneously view the FIB milling process and SEM imaging in real time.

JEOL USA released the JSM-7600F thermal field emission-SEM, capable of a probe current of 200 nA or higher at an accelerating voltage of 15 kV.

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