Company Announcements

Phenom-World BV named Struers A/S as its exclusive distributor for Denmark, Finland, Norway and Sweden.

In September, Thermo Fisher Scientific established a sales and support office for microanalysis products at its UK commercial headquarters in Hemel Hempstead.

In October, Olympus America began selling and servicing its microscopes directly in the region surrounding its headquarters in Pennsylvania’s Lehigh Valley.

Xradia in September named Cannon Marketing Japan its exclusive distributor for Japan.

Product Introductions

Phenom-World BV launched the Phenom Pro Suite for its desktop scanning electron microscope (SEM) for expanded functionality.

Hitachi High-Technologies introduced the HT7700 transmission electron microscope, which integrates operation into a single monitor system and allows for sample observation under normal room light conditions.

Hitachi High-Technologies launched the SU8040 field emission (FE)-SEM, featuring the Regulus (regulated ultra stable) Stage and optional cell count assist software.

Carl Zeiss released a new gas injection system for the ORION Plus Helium Ion Microscope.

Carl Zeiss launched the Shuttle & Find hardware/software interface to connect light microscopes and SEMs for correlative microscopy in the life sciences.

FEI introduced the ultra high–resolution Nova NanoSEM 50 Series, featuring imaging down to the nanometer level, high beam current, low vacuum capability and a new suite of detectors.

FEI released four software packages for electron microscopy use in life science, featuring correlative navigation utility for the correlation of navigational coordinate systems between different types of microscopes and the ARGOS 3D template-fitting capability.

FEI launched the Mineral Liberation Analyzer v 3.0 and iDiscover v 5.0 and announced that its QEMSCAN software for natural resource extraction is now available on the Quanta 650 SEM.

Agilent introduced the compact Agilent 8500 FE-SEM, which is optimized for low-voltage imaging, enhanced surface contrast and plug-and-play performance.

Xradia launched the UltraXRM-L200 X-ray computed tomography microscope for detailed 3D volumetric data of internal structures.

JEOL introduced the JSM-7001FTTLS (through-the-lens system) LV SEM, which enables ultra high–resolution imaging at low kilovolts and high spatial resolution microanalysis.

In September, Oxford Instruments launched the next-generation X-Max range of large area silicon drift detectors with resolution down to 124 eV Mn and 48 eV C.