New Relate Software for Correlative Imaging with Atomic Force Microscopy and Electron Microscopy

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(Santa Barbara, CA).  Oxford Instruments Asylum Research is pleased to announce the release of the new “Relate” software package for correlative imaging with Asylum Research AFMs, electron microscopes, and Oxford Instruments NanoAnalysis EDS and EBSD detectors. The Relate software makes it simple to correlate, visualise, and analyse the multitude of image data types generated by […]

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Park Systems, the leading innovator in Atomic Force Microscopy, opens a NEW PARK UK OFFICE in Nottingham, United Kingdom

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Park Systems expends its leadership in Europe by establishing Park Systems UK Limited, based in Nottingham to serve the best the British and Irish SPM community I am delighted to be appointed as part of the UK Park Team and to continue their vision of sharing innovative technology for the purpose of continuing the legacy […]

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Asylum Research and Covalent Metrology Collaborate to Promote Industrial Applications of Advanced Atomic Force Microscopy

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Partnership Includes Providing Services to Leading Edge Biotech Researchers Santa Barbara, CA and Sunnyvale, CA — Oxford Instruments Asylum Research and Covalent Metrology Services announced today that the two companies have signed a joint collaboration aimed at further developing and promoting commercial applications for several advanced modes of atomic force microscopy (AFM). Oxford Instruments Asylum Research designs […]

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Scanning Capacitance Microscopy: Asylum Research Jupiter XR

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Santa Barbara, CA — Oxford Instruments Asylum Research is pleased to announce the release of a new Scanning Capacitance Microscopy (SCM) accessory for its Cypher and Jupiter XR atomic force microscopes (AFMs). SCM is a powerful imaging technique that can map electric charge carrier locations, types (p-type vs. n-type), and relative dopant concentration in semiconductors […]

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