Shimadzu Corporation has established a subsidiary in Mexico and has begun its activities. To date, in Mexico, analytical and measuring instruments are distributed by a subsidiary in the United States, while medical systems are marketed through a subsidiary in Brazil. The establishment of Shimadzu México, S. A. de C.V. (SMX) in the capital, Mexico City, […]

Santa Barbara, CA — Oxford Instruments Asylum Research announced today the release of the new Vero VRS1250 Atomic Force Microscope (AFM), which enables video-rate imaging with line scan rates up to 1250 lines/s and frame rates up to 45 frames/s. The Vero VRS1250 is the first and only video-rate AFM to incorporate Quadrature Phase Differential […]

Berwyn, Pa. – AMETEK, Inc. (NYSE: AME) today announced the appointment of John C. Henriques as Vice President, Corporate Development. “I am very pleased to announce John’s promotion to this important role, as he has been a valuable contributor to our Corporate Development team,” commented David A. Zapico, AMETEK Chairman and Chief Executive Officer. “His […]

Berwyn, Pa. – AMETEK, Inc. (NYSE: AME) today announced the appointment of Rob Rideout Jr. as Vice President, Strategic Procurement. “I am delighted to promote Rob to Vice President, Strategic Procurement,” said David A. Zapico, AMETEK Chairman and Chief Executive Officer. “Rob’s exceptional leadership and expertise in supply chain management have been invaluable. We are […]

Oxford, UK – Hitachi High-Tech Analytical Science, a Hitachi High-Tech Corporation wholly owned subsidiary engaged in the manufacture and sales of analysis and measuring instruments, has opened a new state-of-the-art applications laboratory in Krefeld, Germany. The new applications laboratory located at the Hitachi High-Tech European head office combines the strengths of Hitachi High-Tech’s core technology […]

Vista 300. A photo of the complete instrument along with a close-up. Vista 300 can accommodate wafers up to 300 mm. Molecular Vista Inc. (MVI), a company specializing in nano-chemical metrology, is pleased to announce Vista 300 – a nano IR instrument targeted for advanced semiconductor process monitoring and defect analysis. Vista 300 combines an atomic force microscope […]

Park Systems, a leading manufacturer of nano-metrology systems, announces the release of its latest atomic force microscopy (AFM) innovation, Park FX200, designed for 200 mm samples. The FX200 is developed to meet the needs of both research and industrial applications, offering significant advancements in large-sample AFM technology. The FX200 features an advanced mechanical structure that […]

BOSTON — Cellens, Inc., an early-stage cancer diagnostic company pioneering in applying mechanobiology and machine learning analysis today announced that it is collaborating with Bruker BioAFM, a business unit of Bruker (Nasdaq: BRKR), to develop the world’s first clinical diagnostic tests that leverage multi-parametric, single-cell biophysical markers and machine learning. Based on cellular biophysical markers attained using Bruker’s advanced […]

Tokyo – Hitachi High-Tech Corporation (“Hitachi High-Tech”) and Hitachi, Ltd. (“Hitachi”) announced a collaborative creation (“co-creation”) that utilizes the Materials Informatics (“MI”) solutions provided by the Hitachi Group on the “MACSiMUM*”, AI and machine learning platform, operated by Industrial Technology Research Institute (“ITRI”), the largest industrial technology research and development organization in Taiwan. With supported […]

Santa Barbara, CA — Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force microscope (AFM). AR Maps provides roughness information based on ISO standards, generate statistics reports, conduct critical dimension and trench analysis, perform particle analysis, and much more. The new […]