AFM Tip Characterizer (AFMTC) Park Systems, a leading provider of Atomic Force Microscopy (AFM) and nano-metrology solutions, is proud to announce the launch of its Park NANOstandard™ product line. This new product line provides calibration standard samples for AFM and SEM measurements, allowing users to accurately measure and analyze their samples. The Park NANOstandard is […]

New year brings a new cooperation on the business field. We are glad to present you Merrow Scientific, our new partner for the UK market. With the tradition since 2004 and based on previous experience with laboratory equipment, Merrow Scientific decided to grow its portfolio with LiteScope AFM-in-SEM. NenoVision will extend the ranks of existing partner companies offering top-notch instrumentation in the […]

Park Systems, a leading manufacturer of atomic force microscopy (AFM) and nano metrology systems, has introduced its newest product, the Park NX-IR R300, a nanoscale infrared spectroscopy (IR) system for industrial applications. Park NX-IR R300 is an infrared spectroscopy and atomic force microscopy integrated into one, for up to 300 mm semiconductor wafers. It provides […]

Santa Barbara, CA — Oxford Instruments Asylum Research today announces the release of its new nanoscale time-dependent dielectric breakdown (nanoTDDB) high voltage accessory for the Jupiter XR atomic force microscope (AFM). The NanoTDDB technique measures the voltage at which a material undergoes dielectric breakdown. This unique nanoTDDB accessory expands the range of electrical characterization tools available […]

Park Systems, a leading manufacturer of atomic force microscopy (AFM) systems, expands its business portfolio by acquiring Accurion GmbH, a Germany-based company that develops and manufactures imaging spectroscopic ellipsometers (ISE) and active vibration isolations (AVI). To celebrate this strategic expansion, the M&A ceremony took place last Friday, October 14, 2022, in Goettingen, Germany, gathering both […]

SEOUL, South Korea — Park Methods, world-leading producer of Atomic Pressure Microscopes declares Park SmartAnalysis, a next-gen picture processing and information evaluation software program is now obtainable for all Park AFM’s that includes superior picture processing capabilities. SmartAnalysis supplies varied instruments to research, measure, and carry out statistics from the AFM picture and information, that speeds […]

Imaging Spectroscopic Ellipsometry and Active Vibration Isolation Add to Park’s Nanometrology Business Portfolio. Park Systems Corp. today announced that it has acquired Accurion GmbH, a privately held company that develops and manufactures imaging spectroscopic ellipsometers and active vibration isolations. This acquisition adds to Park’s portfolio of atomic force microscopy and white-light interferometric microscopy. Financial details […]

The prizes go to scientists from the US, Germany and China The WITec Paper Awards 2022 have been given to scientists from the US, Germany and China, recognizing their work in cement chemistry, pharmacy and methane hydrate chemistry. Every year, the WITec Paper Award highlights three scientific publications that contain data acquired with a WITec […]

Santa Barbara, CA — Oxford Instruments Asylum Research today announced the launch of the new Cypher L atomic force microscope (AFM). Based on the acclaimed high-performance Cypher AFM platform, the Cypher L is designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage. The Cypher […]

SUWON, South Korea — Park Systems, the world’s leading manufacturer of atomic force microscopes (AFM) is proud to award the Park Systems AFM Scholarship to Gen Liu at Tianjin International Center for Nanoparticles and Nanosystems (TICNN), Tianjin University, China for his research on SECCM. Scanning electrochemical cell microscope is the latest generation of scanning electrochemical microscopy technology. It is designed to […]