New laboratory will host two Rigaku computed tomography (CT) systems: CT Lab GX 130 micro-CT system and nano3DX nano-CT system. Newark, DE. Rigaku Corporation is pleased to announce that the new University of Delaware CT Scanner Facility, based at the Patrick T. Harker Interdisciplinary Science and Engineering Laboratory’s Advanced Materials Characterization Lab (AMCL), will host two advanced […]

Detailed observations of fast biological processes with the SP8 LIGHTNING Mannheim, Germany. World-leading designer and manufacturer of innovative microscope solutions, Leica Microsystems, has announced the launch of a new generation of its leading SP8 confocal microscope platform, now with built-in LIGHTNING detection technology. The next-generation SP8 LIGHTNING confocal microscope offers five highly sensitive detection channels for super-resolution […]

— Featuring a large specimen chamber and advanced functionalities — Tokyo, Japan—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that it will commence sales of the SU3800 and the oversized SU3900 scanning electron microscopes (SEMs) featuring the ability to accommodate large, heavy specimens, along with advanced functionalities for automated measurement and wide-angle camera navigation. […]

MAHWAH, NJ –EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation has added a new, faster, low-noise CMOS camera to its Velocity™ EBSD Camera Series. The Velocity™ Super is currently the fastest EBSD camera in the world, offering high-speed EBSD mapping with the highest indexing performance on real-world materials. The Velocity™ EBSD Camera […]

LAS X.next, a streamlined software user interface for the DVM6 digital microscope Leica Microsystems introduces LAS X.next, the new streamlined software user interface for the DVM6 digital microscope. Together, they facilitate the acquisition of 2D and 3D scanned images in significantly less time. Users are able to do detailed component analysis for R&D, QC, and failure analysis (FA) […]

Pittcon 2019 – Philadelphia, PA JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it […]

Mannheim, Germany Park Systems, a leading innovator of atomic force microscopy (AFM) technology, proudly announces the opening of a new European subsidiary in Orsay, France. As a fast-paced manufacturer of nanoscale microscopy and metrology products, Park Systems expends its leadership in Europe by establishing Park Systems France. The new European office will serve French, Spanish […]

Jena — Jenoptik signs long-term agreement to develop and produce microscopy imaging instrument with leading life science company based on the technology platform JENOPTIK SYIONS. The scope of the agreement is anticipated to exceed 30 million euros for the coming years. The SYIONS system allows customers to take advantage of a range of imaging technologies and […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope™, to be released in March 2019. Product development background Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries. In addition, SEM applications […]

ZEISS ZEN Connect for the materials research lab JENA/Germany. ZEISS ZEN Connect software module is now available for materials researchers at universities, multi-user facilities or industrial labs. It enables users to bring all imaging technologies together – ZEISS or otherwise – to answer their questions. Gaining unique insights and saving time ZEISS ZEN Connect allows […]